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تسجيل مستخدم جديدTesting multilayer-coated polarizing mirrors for the LAMP soft X-ray telescope
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The LAMP (Lightweight Asymmetry and Magnetism Probe) X-ray telescope is a mission concept to measure the polarization of X-ray astronomical sources at 250 eV via imaging mirrors that reflect at incidence angles near the polarization angle, i.e., 45 deg. Hence, it will require the adoption of multilayer coatings with a few nanometers d-spacing in order to enhance the reflectivity. The nickel electroforming technology has already been successfully used to fabricate the high angular resolution imaging mirrors of the X-ray telescopes SAX, XMM-Newton, and Swift/XRT. We are investigating this consolidated technology as a possible technique to manufacture focusing mirrors for LAMP. Although the very good reflectivity performances of this kind of mirrors were already demonstrated in grazing incidence, the reflectivity and the scattering properties have not been tested directly at the unusually large angle of 45 deg. Other possible substrates are represented by thin glass foils or silicon wafers. In this paper we present the results of the X-ray reflectivity campaign performed at the BEAR beamline of Elettra - Sincrotrone Trieste on multilayer coatings of various composition (Cr/C, Co/C), deposited with different sputtering parameters on nickel, silicon, and glass substrates, using polarized X-rays in the spectral range 240 - 290 eV.
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The Lightweight Asymmetry and Magnetism Probe (LAMP) is a micro-satellite mission concept dedicated for astronomical X-ray polarimetry and is currently under early phase study. It consists of segmented paraboloidal multilayer mirrors with a collectin
g area of about 1300 cm^2 to reflect and focus 250 eV X-rays, which will be detected by position sensitive detectors at the focal plane. The primary targets of LAMP include the thermal emission from the surface of pulsars and synchrotron emission produced by relativistic jets in blazars. With the expected sensitivity, it will allow us to detect polarization or place a tight upper limit for about 10 pulsars and 20 blazars. In addition to measuring magnetic structures in these objects, LAMP will also enable us to discover bare quark stars if they exist, whose thermal emission is expected to be zero polarized, while the thermal emission from neutron stars is believed to be highly polarized due to plasma polarization and the quantum electrodynamics (QED) effect. Here we present an overview of the mission concept, its science objectives and simulated observational results.
Multilayer X-ray mirrors consist of a coating of a large number of alternate layers of high Z and low Z materials with a typical thickness of 10-100 Angstrom, on a suitable substrate. Such coatings play an important role in enhancing the reflectivity
of X-ray mirrors by allowing reflections at angles much larger than the critical angle of X-ray reflection for the given materials. Coating with an equal thickness of each bilayer enhances the reflectivity at discrete energies, satisfying Bragg condition. However, by systematically varying the bilayer thickness in the multilayer stack, it is possible to design X-ray mirrors having enhanced reflectivity over a broad energy range. One of the most important applications of such a depth graded multilayer mirror is to realize hard X-ray telescopes for astronomical purposes. Design of such multilayer X-ray mirrors and their characterization with X-ray reflectivity measurements require appropriate software tools. We have initiated the development of hard X-ray optics for future Indian X-ray astronomical missions, and in this context, we have developed a program, DarpanX, to calculate X-ray reflectivity for single and multilayer mirrors. It can be used as a stand-alone tool for designing multilayer mirrors with required characteristics. But more importantly, it has been implemented as a local model for the popular X-ray spectral fitting program, XSPEC, and thus can be used for accurate fitting of the experimentally measured X-ray reflectivity data. DarpanX is implemented as a Python 3 module, and an API is provided to access the underlying algorithms. Here we present details of DarpanX implementation and its validation for different type multilayer structures. We also demonstrate the model fitting capability of DarpanX for experimental X-ray reflectivity measurements of single and multilayer samples.
A soft X-ray, beam-splitting, multilayer optic has been developed for the Bragg Reflection Polarimeter (BRP) on the NASA Gravity and Extreme Magnetism Small Explorer Mission (GEMS). The optic is designed to reflect 0.5 keV X-rays through a 90 degree
angle to the BRP detector, and transmit 2-10 keV X-rays to the primary polarimeter. The transmission requirement prevents the use of a thick substrate, so a 2 micron thick polyimide membrane was used. Atomic force microscopy has shown the membrane to possess high spatial frequency roughness less than 0.2 nm rms, permitting adequate X-ray reflectance. A multilayer thin film was especially developed and deposited via magnetron sputtering with reflectance and transmission properties that satisfy the BRP requirements and with near-zero stress. Reflectance and transmission measurements of BRP prototype elements closely match theoretical predictions, both before and after rigorous environmental testing.
Future hard X-ray telescopes (e.g. SIMBOL-X and Constellation-X) will make use of hard X-ray optics with multilayer coatings, with angular resolutions comparable to the achieved ones in the soft X-rays. One of the crucial points in X-ray optics, inde
ed, is multilayer interfacial microroughness that causes effective area reduction and X-Ray Scattering (XRS). The latter, in particular, is responsible for image quality degradation. Interfacial smoothness deterioration in multilayer deposition processes is commonly observed as a result of substrate profile replication and intrinsic random deposition noise. For this reason, roughness growth should be carefully investigated by surface topographic analysis, X-ray reflectivity and XRS measurements. It is convenient to express the roughness evolution in terms of interface Power Spectral Densities (PSD), that are directly related to XRS and, in turn, in affecting the optic HEW (Half Energy Width). In order to interpret roughness amplification and to help us to predict the imaging performance of hard X-ray optics, we have implemented a well known kinetic continuum equation model in a IDL language program (MPES, Multilayer PSDs Evolution Simulator), allowing us the determination of characteristic growth parameters in multilayer coatings. In this paper we present some results from analysis we performed on several samples coated with hard X-ray multilayers (W/Si, Pt/C, Mo/Si) using different deposition techniques. We show also the XRS predictions resulting from the obtained modelizations, in comparison to the experimental XRS measurements performed at the energy of 8.05 keV.
The Cherenkov Telescope Array (CTA) is the next generation Cherenkov telescope facility. It will consist of a large number of segmented-mirror telescopes of three different diameters, placed in two locations, one in the northern and one in the southe
rn hemisphere, thus covering the whole sky. The total number of mirror tiles will be on the order of 10,000, corresponding to a reflective area of ~10^4 m^2. The Institute for Astronomy and Astrophysics in Tubingen (IAAT) is currently developing mirror control alignment mechanics, electronics, and software optimized for the medium sized telescopes. In addition, IAAT is participating in the CTA mirror prototype testing. In this paper we present the status of the current developments, the main results of recent tests, and plans for the production phase of the mirror control system. We also briefly present the Tubingen facility for mirror testing.
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