ترغب بنشر مسار تعليمي؟ اضغط هنا

Imaging high-speed friction at the nanometer scale

83   0   0.0 ( 0 )
 نشر من قبل Per-Anders Thor\\'en
 تاريخ النشر 2016
  مجال البحث فيزياء
والبحث باللغة English




اسأل ChatGPT حول البحث

Friction is a complicated phenomenon involving nonlinear dynamics at different length and time scales[1, 2]. The microscopic origin of friction is poorly understood, due in part to a lack of methods for measuring the force on a nanometer-scale asperity sliding at velocity of the order of cm/s.[3, 4] Despite enormous advance in experimental techniques[5], this combination of small length scale and high velocity remained illusive. Here we present a technique for rapidly measuring the frictional forces on a single asperity (an AFM tip) over a velocity range from zero to several cm/s. At each image pixel we obtain the velocity dependence of both conservative and dissipative forces, revealing the transition from stick-slip to a smooth sliding friction[1, 6]. We explain measurements on graphite using a modified Prandtl-Tomlinson model that takes into account the damped elastic deformation of the asperity. With its greatly improved force sensitivity and very small sliding amplitude, our method enables rapid and detailed surface mapping of the full velocity-dependence of frictional forces with less than 10~nm spatial resolution.

قيم البحث

اقرأ أيضاً

We experimentally demonstrate a non-imaging approach to displacement measurement for complex scattering materials. By spatially controlling the wave front of the light that incidents on the material we concentrate the scattered light in a focus on a designated position. This wave front acts as an unique optical fingerprint that enables precise position detection of the illuminated material by simply measuring the intensity in the focus. By combining two optical fingerprints we demonstrate position detection along one dimension with a displacement resolution of 2.1 nm. As our approach does not require an image of the scattered field, it is possible to employ fast non-imaging detectors to enable high-speed position detection of scattering materials.
The Rashba effect as an electrically tunable spin-orbit interaction is the base for a multitude of possible applications such as spin filters, spin transistors, and quantum computing using Majorana states in nanowires. Moreover, this interaction can determine the spin dephasing and antilocalization phenomena in two dimensions. However, the real space pattern of the Rashba parameter has never been probed, albeit it critically influences, e.g., the more robust spin transistors using the spin helix state and the otherwise forbidden electron backscattering in topologically protected channels. Here, we map this pattern down to nanometer length scales by measuring the spin splitting of the lowest Landau level using scanning tunnelling spectroscopy. We reveal strong fluctuations correlated with the local electrostatic potential for an InSb inversion layer with a large Rashba coefficient (~1 eV{AA}). The novel type of Rashba field mapping enables a more comprehensive understanding of the critical fluctuations, which might be decisive towards robust semiconductor-based spintronic devices.
Self-assembled semiconductor quantum dots show remarkable optical and spin coherence properties, which have lead to a concerted research effort examining their potential as a quantum bit for quantum information science1-6. Here, we present an alterna tive application for such devices, exploiting recent achievements of charge occupation control and the spectral tunability of the optical emission of quantum dots by electric fields7 to demonstrate high-sensitivity electric field measurement. In contrast to existing nanometer-scale electric field sensors, such as single electron transistors8-11 and mechanical resonators12,13, our approach relies on homodyning light resonantly Rayleigh scattered from a quantum dot transition with the excitation laser and phase sensitive lock-in detection. This offers both static and transient field detection ability with high bandwidth operation and near unity quantum efficiency. Our theoretical estimation of the static field sensitivity for typical parameters, 0.5 V/m/ surd Hz, compares favorably to the theoretical limit for single electron transistor-based electrometers. The sensitivity level of 5 V/m/ surd Hz we report in this work, which corresponds to 6.4 * 10-6 e/ surd Hz at a distance of 12 nm, is worse than this theoretical estimate, yet higher than any other result attained at 4.2 K or higher operation temperature.
103 - M. Wyss , K. Bagani , D. Jetter 2021
Scanning superconducting quantum interference device (SQUID) microscopy is a magnetic imaging technique combining high-field sensitivity with nanometer-scale spatial resolution. State-of-the-art SQUID-on-tip probes are now playing an important role i n mapping correlation phenomena, such as superconductivity and magnetism, which have recently been observed in two-dimensional van der Waals materials. Here, we demonstrate a scanning probe that combines the magnetic and thermal imaging provided by an on-tip SQUID with the tip-sample distance control and topographic contrast of a non-contact atomic force microscope (AFM). We pattern the nanometer-scale SQUID, including its weak-link Josephson junctions, via focused ion beam milling at the apex of a cantilever coated with Nb, yielding a sensor with an effective diameter of 365 nm, field sensitivity of 9.5 $text{nT}/sqrt{text{Hz}}$ and thermal sensitivity of 620 $text{nK}/sqrt{text{Hz}}$, operating in magnetic fields up to 1.0 T. The resulting SQUID-on-lever is a robust AFM-like scanning probe that expands the reach of sensitive nanometer-scale magnetic and thermal imaging beyond what is currently possible.
The local density of optical states governs an emitters lifetime and quantum yield through the Purcell effect. It can be modified by a surface plasmon electromagnetic field, but such a field has a spatial extension limited to a few hundreds of nanome ters, which complicates the use of optical methods to spatially probe the emitter-plasmon coupling. Here we show that a combination of electron-based imaging, spectroscopies and photon-based correlation spectroscopy enables measurement of the Purcell effect with nanometer and nanosecond spatio-temporal resolutions. Due to the large variability of radiative lifetimes of emitters embedded in nanoparticles with inhomogeneous sizes we relied on a statistical approach to unambiguously probe the coupling between nitrogen-vacancy centers (NV^0) in nanodiamonds and surface plasmons in silver nanocubes. We quantified the Purcell effect by measuring the NV^0 excited state lifetimes in a large number of either isolated nanodiamonds or nanodiamond-nanocube dimers and demonstrated a statistically significant lifetime reduction for dimers.
التعليقات
جاري جلب التعليقات جاري جلب التعليقات
سجل دخول لتتمكن من متابعة معايير البحث التي قمت باختيارها
mircosoft-partner

هل ترغب بارسال اشعارات عن اخر التحديثات في شمرا-اكاديميا