ﻻ يوجد ملخص باللغة العربية
Sensing and imaging are among the most important applications of quantum information science. To investigate their fundamental limits and the possibility of quantum enhancements, researchers have for decades relied on the quantum Cramer-Rao lower error bounds pioneered by Helstrom. Recent work, however, has called into question the tightness of those bounds for highly nonclassical states in the non-asymptotic regime, and better methods are now needed to assess the attainable quantum limits in reality. Here we propose a new class of quantum bounds called quantum Weiss-Weinstein bounds, which include Cramer-Rao-type inequalities as special cases but can also be significantly tighter to the attainable error. We demonstrate the superiority of our bounds through the derivation of a Heisenberg limit and phase-estimation examples.
In an idealistic setting, quantum metrology protocols allow to sense physical parameters with mean squared error that scales as $1/N^2$ with the number of particles involved---substantially surpassing the $1/N$-scaling characteristic to classical sta
The impossibility of superluminal communication is a fundamental principle of physics. Here we show that this principle underpins the performance of several fundamental tasks in quantum information processing and quantum metrology. In particular, we
In multiparameter quantum metrology, the weighted-arithmetic-mean error of estimation is often used as a scalar cost function to be minimized during design optimization. However, other types of mean error can reveal different facets of permissible er
Quantum metrology offers a quadratic advantage over classical approaches to parameter estimation problems by utilizing entanglement and nonclassicality. However, the hurdle of actually implementing the necessary quantum probe states and measurements,
Quantum metrology research promises approaches to build new sensors that achieve the ultimate level of precision measurement and perform fundamentally better than modern sensors. Practical schemes that tolerate realistic fabrication imperfections and