اشترك بالحزمة الذهبية واحصل على وصول غير محدود شمرا أكاديميا
تسجيل مستخدم جديدTriple Patterning Lithography (TPL) Layout Decomposition using End-Cutting (JM3 Special Session)
139
0
0.0
(
0
)
اسأل ChatGPT حول البحث
ﻻ يوجد ملخص باللغة العربية
Triple patterning lithography (TPL) is one of the most promising techniques in the 14nm logic node and beyond. Conventional LELELE type TPL technology suffers from native conflict and overlapping problems. Recently, as an alternative process, triple patterning lithography with end cutting (LELE-EC) was proposed to overcome the limitations of LELELE manufacturing. In LELE-EC process the first two masks are LELE type double patterning, while the third mask is used to generate the end-cuts. Although the layout decomposition problem for LELELE has been well-studied in the literature, only few attempts have been made to address the LELE-EC layout decomposition problem. In this paper we propose the comprehensive study for LELE-EC layout decomposition. Conflict graph and end-cut graph are constructed to extract all the geometrical relationships of both input layout and end-cut candidates. Based on these graphs, integer linear programming (ILP) is formulated to minimize the conflict number and the stitch number. The experimental results demonstrate the effectiveness of the proposed algorithms.
قيم البحث
اقرأ أيضاً
Triple patterning lithography (TPL) is one of the most promising techniques in the 14nm logic node and beyond. However, traditional LELELE type TPL technology suffers from native conflict and overlapping problems. Recently LELEEC process was proposed
to overcome the limitations, where the third mask is used to generate the end-cuts. In this paper we propose the first study for LELEEC layout decomposition. Conflict graphs and end-cut graphs are constructed to extract all the geometrical relationships of input layout and end-cut candidates. Based on these graphs, integer linear programming (ILP) is formulated to minimize the conflict number and the stitch number.
As the feature size of semiconductor process further scales to sub-16nm technology node, triple patterning lithography (TPL) has been regarded one of the most promising lithography candidates. M1 and contact layers, which are usually deployed within
standard cells, are most critical and complex parts for modern digital designs. Traditional design flow that ignores TPL in early stages may limit the potential to resolve all the TPL conflicts. In this paper, we propose a coherent framework, including standard cell compliance and detailed placement to enable TPL friendly design. Considering TPL constraints during early design stages, such as standard cell compliance, improves the layout decomposability. With the pre-coloring solutions of standard cells, we present a TPL aware detailed placement, where the layout decomposition and placement can be resolved simultaneously. Our experimental results show that, with negligible impact on critical path delay, our framework can resolve the conflicts much more easily, compared with the traditional physical design flow and followed layout decomposition.
We consider the problem of maximizing the number of people that a dining room can accommodate provided that the chairs belonging to different tables are socially distant. We introduce an optimization model that incorporates several characteristics of
the problem, namely: the type and size of surface of the dining room, the shapes and sizes of the tables, the positions of the chairs, the sitting sense of the customers, and the possibility of adding space separators to increase the capacity. We propose a simple yet general set-packing formulation for the problem. We investigate the efficiency of space separators and the impact of considering the sitting sense of customers in the room capacity. We also perform an algorithmic analysis of the model, and assess its scalability to the problem size, the presence of (or lack thereof) room separators, and the consideration of the sitting sense of customers.
Layout fracturing is a fundamental step in mask data preparation and e-beam lithography (EBL) writing. To increase EBL throughput, recently a new L-shape writing strategy is proposed, which calls for new L-shape fracturing, versus the conventional re
ctangular fracturing. Meanwhile, during layout fracturing, one must minimize very small/narrow features, also called slivers, due to manufacturability concern. This paper addresses this new research problem of how to perform L-shaped fracturing with sliver minimization. We propose two novel algorithms. The first one, rectangular merging (RM), starts from a set of rectangular fractures and merges them optimally to form L-shape fracturing. The second algorithm, direct L-shape fracturing (DLF), directly and effectively fractures the input layouts into L-shapes with sliver minimization. The experimental results show that our algorithms are very effective.
Accurate layout estimation is crucial for planning and navigation in robotics applications, such as self-driving. In this paper, we introduce the Stereo Birds Eye ViewNetwork (SBEVNet), a novel supervised end-to-end framework for estimation of birds
eye view layout from a pair of stereo images. Although our network reuses some of the building blocks from the state-of-the-art deep learning networks for disparity estimation, we show that explicit depth estimation is neither sufficient nor necessary. Instead, the learning of a good internal birds eye view feature representation is effective for layout estimation. Specifically, we first generate a disparity feature volume using the features of the stereo images and then project it to the birds eye view coordinates. This gives us coarse-grained information about the scene structure. We also apply inverse perspective mapping (IPM) to map the input images and their features to the birds eye view. This gives us fine-grained texture information. Concatenating IPM features with the projected feature volume creates a rich birds eye view representation which is useful for spatial reasoning. We use this representation to estimate the BEV semantic map. Additionally, we show that using the IPM features as a supervisory signal for stereo features can give an improvement in performance. We demonstrate our approach on two datasets:the KITTI dataset and a synthetically generated dataset from the CARLA simulator. For both of these datasets, we establish state-of-the-art performance compared to baseline techniques.
سجل دخول لتتمكن من نشر تعليقات
التعليقات
جاري جلب التعليقات
سجل دخول لتتمكن من متابعة معايير البحث التي قمت باختيارها
