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The displacement of micro-electro-mechanical-systems (MEMS) cantilevers is used to measure a broad variety of phenomena in devices ranging from force microscopes to biochemical sensors to thermal imaging systems. We demonstrate the first direct measurement of a MEMS cantilever displacement with a noise floor at 40% of the shot noise limit (SNL). By combining multi-spatial-mode quantum light sources with a simple differential measurement, we show that sub-SNL MEMS displacement sensitivity is highly accessible compared to previous efforts that measured the displacement of macroscopic mirrors with very distinct spatial structures crafted with multiple optical parametric amplifiers and locking loops. These results support a new class of quantum MEMS sensor with an ultimate signal to noise ratio determined by quantum correlations, enabling ultra-trace sensing, imaging, and microscopy applications in which signals were previously obscured by shot noise.
Interferometric phase measurement is widely used to precisely determine quantities such as length, speed, and material properties. Without quantum correlations, the best phase sensitivity $Deltavarphi$ achievable using $n$ photons is the shot noise l
Photonic sensors have many applications in a range of physical settings, from measuring mechanical pressure in manufacturing to detecting protein concentration in biomedical samples. A variety of sensing approaches exist, and plasmonic systems in par
One of the challenges of quantum technologies is realising the quantum advantage, predicted for ideal systems, in real applications, which have to cope with decoherence and inefficiencies. In quantum metrology, sub-shot-noise imaging (SSNI) and sensi
Coherent-state-based phase estimation is a fruitful testbed for the field of precision measurements since coherent states are robust to decoherence when compared with exotic quantum states. The seminal work done by Caves (https://doi.org/10.1103/Phys
Magneto-optical sensors including spin noise spectroscopies and magneto-optical Kerr effect microscopies are now ubiquitous tools for materials characterization that can provide new understanding of spin dynamics, hyperfine interactions, spin-orbit i