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Specific contact resistivity measurements have conventionally been heavy in both fabrication and simulation/calculation in order to account for complicated geometries and other effects such as parasitic resistance. We propose a simpler geometry to deliver current, and the use of a scanning voltage probe to sense the potential variation along the sample surface, from which the specific contact resistivity can be straightforwardly deduced. We demonstrate an analytical example in the case where both materials are thin films. Experimental data with a scanning Kelvin probe measurement on graphene from the literature corroborates our model calculation.
We demonstrate how a single scanning voltage probe can be used to map the local conductivity and current density in a thin film with no a priori knowledge of the geometry of the electrical contacts. With state-of-the-art scanning voltage probes, unde
We present the design and experimental results of a near-field scanning microwave microscope (NSMM) working at a frequency of 1GHz. Our microscope is unique in that the sensing probe is separated from the excitation electrode to significantly suppres
We investigate the effects of roughness and fractality on the normal contact stiffness of rough surfaces. Samples of isotropically roughened aluminium surfaces are considered. The roughness and fractal dimension were altered through blasting using di
A stripline-type near-field microwave probe is microfabricated for microwave impedance microscopy. Unlike the poorly shielded coplanar probe that senses the sample tens of microns away, the stripline structure removes the stray fields from the cantil
Knowledge of mechanical and physical property evolution due to irradiation damage is essential for the development of future fission and fusion reactors. Ion-irradiation provides an excellent proxy for studying irradiation damage, allowing high damag