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The so-called excess noise limits the energy resolution of transition-edge sensor (TES) detectors, and its physical origin has been unclear, with many competing models proposed. Here we present the noise and impedance data analysis of a rectangular X-ray Ti/Au TES fabricated at SRON. To account for all the major features in the impedance and noise data simultaneously, we have used a thermal model consisting of three blocks of heat capacities, whereas a two-block model is clearly insufficient. The implication is that, for these detectors, the excess noise is simply thermal fluctuation noise of the internal parts of the device. Equations for the impedance and noise for a three-block model are also given.
Superconducting microwave resonators are reliable circuits widely used for detection and as test devices for material research. A reliable determination of their external and internal quality factors is crucial for many modern applications, which eit
Transition Edge Sensors (TESs) are the selected technology for future spaceborne X-ray observatories, such as Athena, Lynx, and HUBS. These missions demand thousands of pixels to be operated simultaneously with high energy-resolving power. To reach t
Future far-infrared astronomy missions will need large arrays of detectors with exceptionally low noise-equivalent power (NEP), with some mission concepts calling for thousands of detectors with NEPs below a few $times 10^{-20}$ W/$sqrt{mathrm{Hz}}$.
In order to investigate the origin of the until now unaccounted excess noise and to minimize the uncontrollable phenomena at the transition in X-ray microcalorimeters we have developed superconducting transition-edge sensors into an edgeless geometry
Resonant soft x-ray scattering (RSXS) is a leading probe of valence band order in materials best known for detecting charge density wave order in the copper-oxide superconductors. One of the biggest limitations on the RSXS technique is the presence o