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تسجيل مستخدم جديدConcept for controlled transverse emittance transfer within a linac ion beam
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Lars Groening
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For injection of beams into circular machines with different horizontal and vertical emittance acceptance, the injection efficiency can be increased if these beams are flat, i.e. if they feature unequal transverse emittances. Generation of flat electron beams is well known and has been demonstrated already in beam experiments. It was proposed also for ion beams that were generated in an Electron Cyclotron-Resonance (ECR) source. We introduce an extension of the method to beams that underwent charge state stripping without requiring their generation inside an ECR source. Results from multi-particle simulations are presented to demonstrate the validity of the method.
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ple beam profiler method. The core of the system is constituted by four consecutive UniBEaM profilers, which are based on silica fibers passing across the beam. The $^{4}$PrOB$varepsilon$aM system was deployed for characterization studies of the 18~MeV proton beam produced by the IBA Cyclone 18 MeV cyclotron at Bern University Hospital (Inselspital). The machine serves daily radioisotope production and multi-disciplinary research, which is carried out with a specifically conceived Beam Transport Line (BTL). The transverse RMS beam emittance of the cyclotron was measured as a function of several machine parameters, such as the magnetic field, RF peak voltage, and azimuthal angle of the stripper. The beam emittance was also measured using the method based on the quadrupole strength variation. The results obtained with both techniques were compared and a good agreement was found. In order to characterize the longitudinal dynamics, the proton energy distribution was measured. For this purpose, a method was developed based on aluminum absorbers of different thicknesses, a UniBEaM detector, and a Faraday cup. The results were an input for a simulation of the BTL developed in the MAD-X software. This tool allows machine parameters to be tuned online and the beam characteristics to be optimized for specific applications.
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