ﻻ يوجد ملخص باللغة العربية
In order to demonstrate the usefulness of the only one existing method for systematic error estimations in VNA (Vector Network Analyzer) measurements by using complex DERs (Differential Error Regions), we compare one-port VNA measurements after the two well-known calibration techniques: the quick reflection response, that uses only a single S (Short circuit) standard, and the time-consuming full one-port, that uses a triple of SLO standards (Short circuit, matching Load, Open circuit). For both calibration techniques, the comparison concerns: (a) a 3D geometric representation of the difference between VNA readings and measurements, and (b) a number of presentation figures for the DERs and their polar DEIs (Differential Error Intervals) of the reflection coefficient, as well as, the DERs and their rectangular DEIs of the corresponding input impedance. In this paper, we present the application of this method to an AUT (Antenna Under Test) selected to highlight the existence of practical cases in which the time consuming calibration technique results a systematic error estimation stripe including almost all of that of quick calibration.
This paper introduces a one-port method for estimating model parameters of VNA calibration standards. The method involves measuring the standards through an asymmetrical passive network connected in direct mode and then in reverse mode, and using the
In the paper, a comparison is described of the microwave power standard based on thermoelectric sensors against an analogous standard based on bolometric sensors. Measurements have been carried out with the classical twin-type microcalorimeter, fitte
An analytical method was developed to estimate errors in quantities depended on full one-port vector network analyser (VNA) measurements using differentials and a complex differential error region (DER) was defined. To evaluate the method, difference
The objective was to study uncertainty in antenna input impedance resulting from full one-port Vector Network Analyzer (VNA) measurements. The VNA process equation in the reflection coefficient p of a load, its measurement m and three errors Es -dete
As noble liquid time projection chambers grow in size their high voltage requirements increase, and detailed, reproducible studies of dielectric breakdown and the onset of electroluminescence are needed to inform their design. The Xenon Breakdown App