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تسجيل مستخدم جديدRandomized benchmarking and process tomography for gate errors in a solid-state qubit
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We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double pi pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1+/-0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.
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ich has been allowed to decohere for three different time periods. In each case the process is found in terms of the chi matrix representation and the affine map representation. The discrepancy between experimentally estimated process and the closest physically valid process is noted. The results of QPT performed after three different decoherence times are used to find the error generators, or Lindblad operators, for the system, using the technique introduced by Boulant et al. [N. Boulant, T.F. Havel, M.A. Pravia and D.G. Cory, Phys. Rev. A 67, 042322 (2003)].
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