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تسجيل مستخدم جديدEffects of Nitrogen contamination in liquid Argon
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A dedicated test of the effects of Nitrogen contamination in liquid Argon has been performed at the INFN-Gran Sasso Laboratory (LNGS, Italy) within the WArP R&D program. A detector has been designed and assembled for this specific task and connected to a system for the injection of controlled amounts of gaseous Nitrogen into the liquid Argon. Purpose of the test is to detect the reduction of the Ar scintillation light emission as a function of the amount of the Nitrogen contaminant injected in the Argon volume. A wide concentration range, spanning from about 10^-1 ppm up to about 10^3 ppm, has been explored. Measurements have been done with electrons in the energy range of minimum ionizing particles (gamma-conversion from radioactive sources). Source spectra at different Nitrogen contaminations are analyzed, showing sensitive reduction of the scintillation yield at increasing concentrations. The rate constant of the light quenching process induced by Nitrogen in liquid Ar has been found to be k(N2)=0.11 micros^-1 ppm^-1. Direct PMT signals acquisition at high time resolution by fast Waveform recording allowed to extract with high precision the main characteristics of the scintillation light emission in pure and contaminated LAr. In particular, the decreasing behavior in lifetime and relative amplitude of the slow component is found to be appreciable from O(1 ppm) of Nitrogen concentrations.
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A dedicated test of the effects of Oxygen contamination in liquid Argon has been performed at the INFN-Gran Sasso Laboratory (LNGS, Italy) within the WArP R&D program. Two detectors have been used: the WArP 2.3 lt prototype and a small (0.7 lt) dedic
ated detector, coupled with a system for the injection of controlled amounts of gaseous Oxygen. Purpose of the test with the 0.7 lt detector is to detect the reduction of the long-lived component lifetime of the Argon scintillation light emission at increasing O2 concentration. Data from the WArP prototype are used for determining the behavior of both the ionization electron lifetime and the scintillation long-lived component lifetime during the O2-purification process activated in closed loop during the acquisition run. The electron lifetime measurements allow to infer the O2 content of the Argon and correlate it with the long-lived scintillation lifetime data. The effect of Oxygen contamination on the scintillation light has been thus measured over a wide range of O2 concentration, spanning from about 10^-3 ppm up to about 10 ppm. The rate constant of the light quenching process induced by Oxygen in LAr has been found to be k(O2)=0.54+-0.03 micros^-1 ppm^-1.
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