We measure the excitation spectrum of a superconducting atomic contact. In addition to the usual continuum above the superconducting gap, the single particle excitation spectrum contains discrete, spin-degenerate Andreev levels inside the gap. Quasip
article excitations are induced by a broadband on-chip microwave source and detected by measuring changes in the supercurrent flowing through the atomic contact. Since microwave photons excite quasiparticles in pairs, two types of transitions are observed: Andreev transitions, which consists of putting two quasiparticles in an Andreev level, and transitions to odd states with a single quasiparticle in an Andreev level and the other one in the continuum. In contrast to absorption spectroscopy, supercurrent spectroscopy allows detection of long-lived odd states.
Fluctuations of the current through a tunnel junction are measured using a Josephson junction. The current noise adds to the bias current of the Josephson junction and affects its switching out of the supercurrent branch. The experiment is carried ou
t in a regime where switching is determined by thermal activation. The variance of the noise results in an elevated effective temperature, whereas the third cumulant, related to its asymmetric character, leads to a difference in the switching rates observed for opposite signs of the current through the tunnel junction. Measurements are compared quantitatively with recent theoretical predictions.
Using a dual-mode STM-AFM microscope operating below 50mK we measured the Local Density of States (LDoS) along small normal wires connected at both ends to superconductors with different phases. We observe that a uniform minigap can develop in the wh
ole normal wire and in the superconductors near the interfaces. The minigap depends periodically on the phase difference. The quasiclassical theory of superconductivity applied to a simplified 1D model geometry accounts well for the data.
Non-Gaussian fluctuations of the electrical current can be detected with a Josephson junction placed on-chip with the noise source. We present preliminary measurements with an NIS junction as a noise source, and a Josephson junction in the thermal es
cape regime as a noise detector. It is shown that the Josephson junction detects not only the average noise, which manifests itself as an increased effective temperature, but also the noise asymmetry. A theoretical description of the thermal escape of a Josephson junction in presence of noise with a non-zero third cumulant is presented, together with numerical simulations when the noise source is a tunnel junction with Poisson noise. Comparison between experiment and theory is discussed.
The voltage oscillations which occur in an ideally current-biased Josephson junction, were proposed to make a current standard for metrology. We demonstrate similar oscillations in a more complex Josephson circuit derived from the Cooper pair box: th
e quantronium. When a constant current I is injected in the gate capacitor of this device, oscillations develop at the frequency fB=I/2e, with e the electron charge. We detect these oscillations through the sidebands induced at multiples of fB in the spectrum of a microwave signal reflected on the circuit, up to currents I exceeding 100 pA. We discuss the potential interest of this current to frequency conversion experiment for metrology.
