Low temperature growth Pr0.7Ca0.3MnO3 (PCMO) thin film showed high performance in electric field induced resistance switching (RS). To understand the micro-mechanism of RS in Metal/PCMO/Metal devices, structure evolution of PCMO under external electr
ic field monitored inside transmission electron microscope (TEM) were performed. Evolution of the modulation stripe in as-grown PCMO sample was investigated when applying electric field. The new-generated modulation stripe gradually disappeared. These results indicate that oxygen ion migration plays a key role in RS.
Vertically aligned ZnO nanotube arrays fabricated on an ITO substrate are found to exhibit strong persistent photoconductivity (PPC) effect and electrically driven conductance switching behavior, though the latter shows a gradual decay from high cond
uctance state to a low conductance state. Unlike the electrical switching, the PPC cannot be reset or reversed by an electrical pulse. Excitation wavelength dependent conductance measurement indicates the presence of the defect localized states (DLS) ~ 240meV above the valence band edge, in support of the hypothesis that the doubly ionization of these DLS are responsible for the PPC effect.
