Ptychography by changing the area of probe light and scaled ptychography

Ptychography is a promising phase retrieval technique for visible light, X-ray and electron beams. Conventional ptychography reconstructs the amplitude and phase of an object light from a set of the diffraction intensity patterns obtained by the X-Y moving of the probe light. The X-Y moving of the probe light requires two control parameters and accuracy of the locations. We propose ptychography by changing the area of the probe light using only one control parameter, instead of the X-Y moving of the probe light. The proposed method has faster convergence speed. In addition, we propose scaled ptychography using scaled diffraction calculation in order to magnify retrieved object lights clearly.

Aliasing-reduced Fresnel diffraction with scale and shift operations

Numerical simulation of Fresnel diffraction with fast Fourier transform (FFT) is widely used in optics, especially computer holography. Fresnel diffraction with FFT cannot set different sampling rates between source and destination planes, while shifted-Fresnel diffraction can set different rates. However, an aliasing error may be incurred in shifted-Fresnel diffraction in a short propagation distance, and the aliasing conditions have not been investigated. In this paper, we investigate the aliasing conditions of shifted-Fresnel diffraction and improve its properties based on the conditions.