Embracing the Unreliability of Memory Devices for Neuromorphic Computing

The emergence of resistive non-volatile memories opens the way to highly energy-efficient computation near- or in-memory. However, this type of computation is not compatible with conventional ECC, and has to deal with device unreliability. Inspired by the architecture of animal brains, we present a manufactured differential hybrid CMOS/RRAM memory architecture suitable for neural network implementation that functions without formal ECC. We also show that using low-energy but error-prone programming conditions only slightly reduces network accuracy.

Implementing Binarized Neural Networks with Magnetoresistive RAM without Error Correction

One of the most exciting applications of Spin Torque Magnetoresistive Random Access Memory (ST-MRAM) is the in-memory implementation of deep neural networks, which could allow improving the energy efficiency of Artificial Intelligence by orders of magnitude with regards to its implementation on computers and graphics cards. In particular, ST-MRAM could be ideal for implementing Binarized Neural Networks (BNNs), a type of deep neural networks discovered in 2016, which can achieve state-of-the-art performance with a highly reduced memory footprint with regards to conventional artificial intelligence approaches. The challenge of ST-MRAM, however, is that it is prone to write errors and usually requires the use of error correction. In this work, we show that these bit errors can be tolerated by BNNs to an outstanding level, based on examples of image recognition tasks (MNIST, CIFAR-10 and ImageNet): bit error rates of ST-MRAM up to 0.1% have little impact on recognition accuracy. The requirements for ST-MRAM are therefore considerably relaxed for BNNs with regards to traditional applications. By consequence, we show that for BNNs, ST-MRAMs can be programmed with weak (low-energy) programming conditions, without error correcting codes. We show that this result can allow the use of low energy and low area ST-MRAM cells, and show that the energy savings at the system level can reach a factor two.

Outstanding Bit Error Tolerance of Resistive RAM-Based Binarized Neural Networks

Resistive random access memories (RRAM) are novel nonvolatile memory technologies, which can be embedded at the core of CMOS, and which could be ideal for the in-memory implementation of deep neural networks. A particularly exciting vision is using them for implementing Binarized Neural Networks (BNNs), a class of deep neural networks with a highly reduced memory footprint. The challenge of resistive memory, however, is that they are prone to device variation, which can lead to bit errors. In this work we show that BNNs can tolerate these bit errors to an outstanding level, through simulations of networks on the MNIST and CIFAR10 tasks. If a standard BNN is used, up to 10^-4 bit error rate can be tolerated with little impact on recognition performance on both MNIST and CIFAR10. We then show that by adapting the training procedure to the fact that the BNN will be operated on error-prone hardware, this tolerance can be extended to a bit error rate of 4x10^-2. The requirements for RRAM are therefore a lot less stringent for BNNs than more traditional applications. We show, based on experimental measurements on a RRAM HfO2 technology, that this result can allow reduce RRAM programming energy by a factor 30.

In-Memory and Error-Immune Differential RRAM Implementation of Binarized Deep Neural Networks

RRAM-based in-Memory Computing is an exciting road for implementing highly energy efficient neural networks. This vision is however challenged by RRAM variability, as the efficient implementation of in-memory computing does not allow error correction. In this work, we fabricated and tested a differential HfO2-based memory structure and its associated sense circuitry, which are ideal for in-memory computing. For the first time, we show that our approach achieves the same reliability benefits as error correction, but without any CMOS overhead. We show, also for the first time, that it can naturally implement Binarized Deep Neural Networks, a very recent development of Artificial Intelligence, with extreme energy efficiency, and that the system is fully satisfactory for image recognition applications. Finally, we evidence how the extra reliability provided by the differential memory allows programming the devices in low voltage conditions, where they feature high endurance of billions of cycles.