We measure localized and extended mode profiles at the band edge of slow-light photonic-crystal waveguides using phase-sensitive near-field microscopy. High-resolution band structures are obtained and interpreted, allowing the retrieval of the optica
l density of states (DOS). This constitutes a first observation of the DOS of a periodic system with weak disorder. The Van Hove singularity in the DOS expected at the band edge of an ideal 1D periodic structure is removed by the disorder. The Anderson-localized states form a tail in the density of states, as predicted by Lifshitz for solid-state systems.
We perform phase-sensitive near-field scanning optical microscopy on photonic-crystal waveguides. The observed intricate field patterns are analyzed by spatial Fourier transformations, revealing several guided TE- and TM-like modes. Using the reconst
ruction algorithm proposed by Ha, et al. (Opt. Lett. 34 (2009)), we decompose the measured two-dimensional field pattern in a superposition of propagating Bloch modes. This opens new possibilities to study specific modes in near-field measurements. We apply the method to study the transverse behavior of a guided TE-like mode, where the mode extends deeper in the surrounding photonic crystal when the band edge is approached.
