We present a comprehensive analysis of strong-lensing, weak-lensing shear and magnification data for a sample of 16 X-ray-regular and 4 high-magnification galaxy clusters selected from the CLASH survey. Our analysis combines constraints from 16-band
HST observations and wide-field multi-color imaging taken primarily with Subaru/Suprime-Cam. We reconstruct surface mass density profiles of individual clusters from a joint analysis of the full lensing constraints, and determine masses and concentrations for all clusters. We find internal consistency of the ensemble mass calibration to be $le 5% pm 6%$ by comparison with the CLASH weak-lensing-only measurements of Umetsu et al. For the X-ray-selected subsample, we examine the concentration-mass relation and its intrinsic scatter using a Bayesian regression approach. Our model yields a mean concentration of $c|_{z=0.34} = 3.95 pm 0.35$ at $M_{200c} simeq 14times 10^{14}M_odot$ and an intrinsic scatter of $sigma(ln c_{200c}) = 0.13 pm 0.06$, in excellent agreement with LCDM predictions when the CLASH selection function based on X-ray morphological regularity and the projection effects are taken into account. We also derive an ensemble-averaged surface mass density profile for the X-ray-selected subsample by stacking their individual profiles. The stacked mass profile is well described by a family of density profiles predicted for cuspy dark-matter-dominated halos, namely, the NFW, Einasto, and DARKexp models, whereas the single power-law, cored isothermal and Burkert density profiles are disfavored by the data. We show that cuspy halo models that include the two-halo term provide improved agreement with the data. For the NFW halo model, we measure a mean concentration of $c_{200c} = 3.79^{+0.30}_{-0.28}$ at $M_{200c} = 14.1^{+1.0}_{-1.0}times 10^{14}M_odot$, demonstrating consistency between complementary analysis methods.
We investigate whether the large scale structure environment of galaxy clusters imprints a selection bias on Sunyaev Zeldovich (SZ) catalogs. Such a selection effect might be caused by line of sight (LoS) structures that add to the SZ signal or conta
in point sources that disturb the signal extraction in the SZ survey. We use the Planck PSZ1 union catalog (Planck Collab- oration et al. 2013a) in the SDSS region as our sample of SZ selected clusters. We calculate the angular two-point correlation function (2pcf) for physically correlated, foreground and background structure in the RedMaPPer SDSS DR8 catalog with respect to each cluster. We compare our results with an optically selected comparison cluster sample and with theoretical predictions. In contrast to the hypothesis of no environment-based selection, we find a mean 2pcf for background structures of -0.049 on scales of $lesssim 40$, significantly non-zero at $sim 4 sigma$, which means that Planck clusters are more likely to be detected in regions of low background density. We hypothesize this effect arises either from background estimation in the SZ survey or from radio sources in the background. We estimate the defect in SZ signal caused by this effect to be negligibly small, of the order of $sim 10^{-4}$ of the signal of a typical Planck detection. Analogously, there are no implications on X-ray mass measurements. However, the environ- mental dependence has important consequences for weak lensing follow up of Planck galaxy clusters: we predict that projection effects account for half of the mass contained within a 15 radius of Planck galaxy clusters. We did not detect a background underdensity of CMASS LRGs, which also leaves a spatially varying redshift dependence of the Planck SZ selection function as a possible cause for our findings.
Interaction of charges in CCDs with the already accumulated charge distribution causes both a flux dependence of the point-spread function (an increase of observed size with flux, also known as the brighter/fatter effect) and pixel-to-pixel correlati
ons of the Poissonian noise in flat fields. We describe these effects in the Dark Energy Camera (DECam) with charge dependent shifts of effective pixel borders, i.e. the Antilogus et al. (2014) model, which we fit to measurements of flat-field Poissonian noise correlations. The latter fall off approximately as a power-law r^-2.5 with pixel separation r, are isotropic except for an asymmetry in the direct neighbors along rows and columns, are stable in time, and are weakly dependent on wavelength. They show variations from chip to chip at the 20% level that correlate with the silicon resistivity. The charge shifts predicted by the model cause biased shape measurements, primarily due to their effect on bright stars, at levels exceeding weak lensing science requirements. We measure the flux dependence of star images and show that the effect can be mitigated by applying the reverse charge shifts at the pixel level during image processing. Differences in stellar size, however, remain significant due to residuals at larger distance from the centroid.
