Thermodynamics of tip-induced nanodomain formation in scanning probe microscopy of ferroelectric films and crystals is studied using the Landau-Ginzburg-Devonshire phenomenological approach. The local redistribution of polarization induced by the bia
sed probe apex is analyzed including the effects of polarization gradients, field dependence of dielectric properties, intrinsic domain wall width, and film thickness. The polarization distribution inside subcritical nucleus of the domain preceding the nucleation event is very smooth and localized below the probe, and the electrostatic field distribution is dominated by the tip. In contrast, polarization distribution inside the stable domain is rectangular-like, and the associated electrostatic fields clearly illustrate the presence of tip-induced and depolarization field components. The calculated coercive biases of domain formation are in a good agreement with available experimental results for typical ferroelectric materials. The microscopic origin of the observed domain tip elongation in the region where the probe electric field is much smaller than the intrinsic coercive field is the positive depolarization field in front of the moving counter domain wall. For infinitely thin domain walls local domain breakdown through the sample depth appears. The results obtained here are complementary to the Landauer-Molotskii energetic approach.
The interaction of ferroelectric 180 degree domain wall with a strongly inhomogeneous electric field of biased Scanning Probe Microscope tip is analyzed within continuous Landau-Ginzburg-Devonshire theory. Equilibrium shape of the initially flat doma
in wall boundary bends, attracts or repulses from the probe apex, depending on the sign and value of the applied bias. For large tip-wall separations, the probe-induced domain nucleation is possible. The approximate analytical expressions for the polarization distribution are derived using direct variational method. The expressions provide insight how the equilibrium polarization distribution depends on the wall finite-width, correlation and depolarization effects, electrostatic potential distribution of the probe and ferroelectric material parameters.
We study the effect of depolarization field related with inhomogeneous polarization distribution, strain and surface energy parameters on a domain wall profile near the surface of a ferroelectric film within the framework of Landau-Ginzburg-Devonshir
e phenomenology. Both inhomogeneous elastic stress and positive surface energy lead to the wall broadening at electrically screened surface. For ferroelectrics with weak piezoelectric coupling, the extrapolation length that defines surface energy parameter, affects the wall broadening more strongly than inhomogeneous elastic stress. Unexpectedly, the domain wall profile follows a long-range power law when approaching the surface, while it saturates exponentially in the bulk. In materials with high piezoelectric coupling and negligibly small surface energy (i.e. high extrapolation length) inhomogeneous elastic stress effect dominates.
