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Register a new userTheory of a magnetic microscope with nanometer resolution
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We propose a theory for a type of apertureless scanning near field microscopy that is intended to allow the measurement of magnetism on a nanometer length scale. A scanning probe, for example a scanning tunneling microscope (STM) tip, is used to scan a magnetic substrate while a laser is focused on it. The electric field between the tip and substrate is enhanced in such a way that the circular polarization due to the Kerr effect, which is normally of order 0.1% is increased by up to two orders of magnitude for the case of a Ag or W tip and an Fe sample. Apart from this there is a large background of circular polarization which is non-magnetic in origin. This circular polarization is produced by light scattered from the STM tip and substrate. A detailed retarded calculation for this light-in-light-out experiment is presented.
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We propose an approach for super-resolution optical lithography which is based on the inverse of magnetic resonance imaging (MRI). The technique uses atomic coherence in an ensemble of spin systems whose final state population can be optically detected. In principle, our method is capable of producing arbitrary one and two dimensional high-resolution patterns with high contrast.
Atomic resolution imaging in transmission electron microscopy (TEM) and scanning TEM (STEM) of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered when illuminated with electrons. These issues have driven the development of TEM and STEM techniques that enable the structural analysis of electron beam-sensitive and weakly scattering nano-materials. Here, we demonstrate such a technique, STEM holography, capable of absolute phase and amplitude object wave measurement with respect to a vacuum reference wave. We use an amplitude-dividing nanofabricated grating to prepare multiple spatially separated electron diffraction probe beams focused at the sample plane, such that one beam transmits through the specimen while the others pass through vacuum. We raster-scan the diffracted probes over the region of interest. We configure the post specimen imaging system of the microscope to diffraction mode, overlapping the probes to form an interference pattern at the detector. Using a fast-readout, direct electron detector, we record and analyze the interference fringes at each position in a 2D raster scan to reconstruct the complex transfer function of the specimen, t(x). We apply this technique to image a standard target specimen consisting of gold nanoparticles on a thin amorphous carbon substrate, and demonstrate 2.4 angstrom resolution phase images. We find that STEM holography offers higher phase-contrast of the amorphous material while maintaining Au atomic lattice resolution when compared with high angle annular dark field STEM.
We present a combination of ferromagnetic resonance (FMR) with spatially and time-resolved X-ray absorption spectroscopy in a scanning transmission X-ray microscope (STXM-FMR). The transverse high frequency component of the resonantly excited magnetization is measured with element-specifity in a Permalloy (Py) disk - Cobalt (Co) stripe bilayer microstructure. STXM-FMR mappings are snapshots of the local magnetization-precession with nm spatial resolution and ps temporal resolution. We directly observe the transfer of angular momentum from Py to Co and vice versa at their respective element-specific resonances. A third resonance could be observed in our experiments, which is identified as a coupled resonance of Py and Co.
We consider a scanning tunneling microscope (STM) such that tunneling occurs through two atomically sharp protrusions on its tip. When the two protrusions are separated by at least several atomic spacings, the differential conductance of this STM depends on the electronic transport in the sample between the protrusions. Furthermore two-protrusion tips commonly occur during STM tip preparation. We explore possible applications to probing dynamical impurity potentials on a metallic surface and local transport in an anisotropic superconductor.
Plasmonic nanostructures and devices are rapidly transforming light manipulation technology by allowing to modify and enhance optical fields on sub-wavelength scales. Advances in this field rely heavily on the development of new characterization methods for the fundamental nanoscale interactions. However, the direct and quantitative mapping of transient electric and magnetic fields characterizing the plasmonic coupling has been proven elusive to date. Here we demonstrate how to directly measure the inelastic momentum transfer of surface plasmon modes via the energy-loss filtered deflection of a focused electron beam in a transmission electron microscope. By scanning the beam over the sample we obtain a spatially and spectrally resolved deflection map and we further show how this deflection is related quantitatively to the spectral component of the induced electric and magnetic fields pertaining to the mode. In some regards this technique is an extension to the established differential phase contrast into the dynamic regime.
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