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Register a new userMulti-Level Contrastive Learning for Few-Shot Problems
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Added by
Qing Chen
Publication date
2021
fields
Informatics Engineering
and research's language is
English
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Contrastive learning is a discriminative approach that aims at grouping similar samples closer and diverse samples far from each other. It it an efficient technique to train an encoder generating distinguishable and informative representations, and it may even increase the encoders transferability. Most current applications of contrastive learning benefit only a single representation from the last layer of an encoder.In this paper, we propose a multi-level contrasitive learning approach which applies contrastive losses at different layers of an encoder to learn multiple representations from the encoder. Afterward, an ensemble can be constructed to take advantage of the multiple representations for the downstream tasks. We evaluated the proposed method on few-shot learning problems and conducted experiments using the mini-ImageNet and the tiered-ImageNet datasets. Our model achieved the new state-of-the-art results for both datasets, comparing to previous regular, ensemble, and contrastive learing (single-level) based approaches.
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Few-shot learning is devoted to training a model on few samples. Recently, the method based on local descriptor metric-learning has achieved great performance. Most of these approaches learn a model based on a pixel-level metric. However, such works can only measure the relations between them on a single level, which is not comprehensive and effective. We argue that if query images can simultaneously be well classified via three distinct level similarity metrics, the query images within a class can be more tightly distributed in a smaller feature space, generating more discriminative feature maps. Motivated by this, we propose a novel Multi-level Metric Learning (MML) method for few-shot learning, which not only calculates the pixel-level similarity but also considers the similarity of part-level features and the similarity of distributions. First, we use a feature extractor to get the feature maps of images. Second, a multi-level metric module is proposed to calculate the part-level, pixel-level, and distribution-level similarities simultaneously. Specifically, the distribution-level similarity metric calculates the distribution distance (i.e., Wasserstein distance, Kullback-Leibler divergence) between query images and the support set, the pixel-level, and the part-level metric calculates the pixel-level and part-level similarities respectively. Finally, the fusion layer fuses three kinds of relation scores to obtain the final similarity score. Extensive experiments on popular benchmarks demonstrate that the MML method significantly outperforms the current state-of-the-art methods.
Few-shot learning aims to transfer information from one task to enable generalization on novel tasks given a few examples. This information is present both in the domain and the class labels. In this work we investigate the complementary roles of these two sources of information by combining instance-discriminative contrastive learning and supervised learning in a single framework called Supervised Momentum Contrastive learning (SUPMOCO). Our approach avoids a problem observed in supervised learning where information in images not relevant to the task is discarded, which hampers their generalization to novel tasks. We show that (self-supervised) contrastive learning and supervised learning are mutually beneficial, leading to a new state-of-the-art on the META-DATASET - a recently introduced benchmark for few-shot learning. Our method is based on a simple modification of MOCO and scales better than prior work on combining supervised and self-supervised learning. This allows us to easily combine data from multiple domains leading to further improvements.
Few-shot learning aims to recognize new categories using very few labeled samples. Although few-shot learning has witnessed promising development in recent years, most existing methods adopt an average operation to calculate prototypes, thus limited by the outlier samples. In this work, we propose a simple yet effective framework for few-shot classification, which can learn to generate preferable prototypes from few support data, with the help of an episodic prototype generator module. The generated prototype is meant to be close to a certain textit{targetproto{}} and is less influenced by outlier samples. Extensive experiments demonstrate the effectiveness of this module, and our approach gets a significant raise over baseline models, and get a competitive result compared to previous methods on textit{mini}ImageNet, textit{tiered}ImageNet, and cross-domain (textit{mini}ImageNet $rightarrow$ CUB-200-2011) datasets.
Most recent few-shot learning (FSL) methods are based on meta-learning with episodic training. In each meta-training episode, a discriminative feature embedding and/or classifier are first constructed from a support set in an inner loop, and then evaluated in an outer loop using a query set for model updating. This query set sample centered learning objective is however intrinsically limited in addressing the lack of training data problem in the support set. In this paper, a novel contrastive prototype learning with augmented embeddings (CPLAE) model is proposed to overcome this limitation. First, data augmentations are introduced to both the support and query sets with each sample now being represented as an augmented embedding (AE) composed of concatenated embeddings of both the original and augment
The goal of few-shot classification is to classify new categories with few labeled examples within each class. Nowadays, the excellent performance in handling few-shot classification problems is shown by metric-based meta-learning methods. However, it is very hard for previous methods to discriminate the fine-grained sub-categories in the embedding space without fine-grained labels. This may lead to unsatisfactory generalization to fine-grained subcategories, and thus affects model interpretation. To tackle this problem, we introduce the contrastive loss into few-shot classification for learning latent fine-grained structure in the embedding space. Furthermore, to overcome the drawbacks of random image transformation used in current contrastive learning in producing noisy and inaccurate image pairs (i.e., views), we develop a learning-to-learn algorithm to automatically generate different views of the same image. Extensive experiments on standard few-shot learning benchmarks demonstrate the superiority of our method.
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