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Register a new userPhotoinduced Magnetic Force Microscopy: Enabling Direct and Exclusive Detection of Optical Magnetism
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Modern optical nano-elements pursue ever-smaller sizes and individualized functionalities. Those elements that can efficiently manipulate the magnetic field of light boast promising future applications with a great challenge: the magnetic near field is irretrievable from conventional optical far-field characterization. Here we propose photoinduced magnetic force microscopy to directly and exclusively sense the magnetic field of light at the nanoscale. The proposed instrument exploits a magnetic nanoprobe with exclusive magnetic excitation under structured light illumination. The magnetic nanoprobe detects the photoinduced magnetic force, which is defined as the dipolar Lorentz force exerted on the photoinduced magnetic dipole in the nanoprobe. Since the resulting magnetic force is proportional to the incident magnetic field, the measured force reveals the magnetic near-field distribution at the nanoscale. The proposed instrument represents a fundamental step towards comprehensive electric and magnetic near-field detection and/or manipulation in single nano-element optical devices.
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We report experimental evidence of a mechanism that supports and intensifies induced magnetization at optical frequencies without the intervention of spin-orbit or spin-spin interactions. Energy-resolved spectra of scattered light, recorded at moderate intensities (108 W/cm2) and short timescales (<150 fs) in a series of non-magnetic molecular liquids, reveal the signature of torque dynamics driven jointly by the electric and magnetic field components of light at the molecular level. While past experiments have recorded radiant magnetization from magneto-electric interactions of this type, no evidence has been provided to date of the inelastic librational features expected in cross-polarized light scattering spectra due to the Lorentz force acting in combination with optical magnetic torque. Here, torque is shown to account for inelastic components in the magnetic scattering spectrum under conditions that produce no such features in electric dipole scattering, in excellent agreement with quantum theoretical predictions
We report a new experimental technique for Kelvin probe force microscopy (KPFM) using the dissipation signal of frequency modulation atomic force microscopy for bias voltage feedback. It features a simple implementation and faster scanning as it requires no low frequency modulation. The dissipation is caused by the oscillating electrostatic force that is coherent with the tip oscillation, which is induced by a sinusoidally oscillating voltage applied between the tip and sample. We analyzed the effect of the phase of the oscillating force on the frequency shift and dissipation and found that the relative phase of 90$^circ$ that causes only the dissipation is the most appropriate for KPFM measurements. The present technique requires a significantly smaller ac voltage amplitude by virtue of enhanced force detection due to the resonance enhancement and the use of fundamental flexural mode oscillation for electrostatic force detection. This feature will be of great importance in the electrical characterizations of technically relevant materials whose electrical properties are influenced by the externally applied electric field as is the case in semiconductor electronic devices.
We report the quantum calibration of a magnetic force microscope (MFM) by measuring the two-dimensional magnetic stray field distribution of the tip MFM using a single nitrogen vacancy (NV) center in diamond. From the measured stray field distribution and the mechanical properties of the cantilever a calibration function is derived allowing to convert MFM images in quantum calibrated stray field maps. This novel approach overcomes limitations of prior MFM calibration schemes and allows quantum calibrated nanoscale stray field measurements in a field range inaccessible by scanning NV magnetometry. Quantum calibrated measurements of a stray field reference sample allow its use as a transfer standard opening the road towards fast and easily accessible quantum traceable calibration of virtually any MFM.
Scattering-type scanning near-field optical microscopy (s-SNOM) is instrumental in exploring polaritonic behaviors of two-dimensional (2D) materials at the nanoscale. A sharp s-SNOM tip couples momenta into 2D materials through phase matching to excite phonon polaritons, which manifest as nanoscale interference fringes in raster images. However, s-SNOM lacks the ability to detect the progression of near-field property along the perpendicular axis to the surface. Here, we perform near-field analysis of a micro-disk and a reflective edge made of isotopically pure hexagonal boron nitride (h-11BN), by using three-dimensional near-field response cubes obtained by peak force scattering-type near-field optical microscopy (PF-SNOM). Momentum quantization of polaritons from the confinement of the circular structure is revealed in situ. Moreover, tip-sample distance is found to be capable of fine-tuning the momentum of polaritons and modifying the superposition of quantized polaritonic modes. The PF-SNOM-based three-dimensional near-field analysis provides detailed characterization capability with a high spatial resolution to fully map three-dimensional near-fields of nano-photonics and polaritonic structures.
Structured metallic tips are increasingly important for optical spectroscopies such as tip-enhanced Raman spectroscopy (TERS), with plasmonic resonances frequently cited as a mechanism for electric field enhancement. We probe the local optical response of sharp and spherical-tipped atomic force microscopy (AFM) tips using a scanning hyperspectral imaging technique to identify plasmonic behaviour. Localised surface plasmon resonances which radiatively couple with far-field light are found only for spherical AFM tips, with little response for sharp AFM tips, in agreement with numerical simulations of the near-field response. The precise tip geometry is thus crucial for plasmon-enhanced spectroscopies, and the typical sharp cones are not preferred.
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