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Register a new userNoise Suppression in X-Ray Fourier-Transform Holography Based on Two-Block Fresnel Zone Plate Interferometer with Common Optical Axis
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Authors
L. A. Haroutunyan
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Strict requirements were imposed on the sizes of testing sample in the previously suggested scheme of hard X-ray Fourier-transform holography based on a two-block Fresnel zone plate interferometer with common optical axis. The failure of these requirements leads to appearance of noise in the reconstructed image. In this work, the mechanism of noise formation, as well as possibility of its suppression are considered.
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A device based on a three-block Fresnel zone plate interferometer is proposed for hard X-ray phase-contrast imaging. The device combines a low requirement for the coherence of the initial radiation (the interferometer operates in the amplitude division mode) with an optical magnification of the image. A numerical simulation of the image formation is carried out, taking into account the limited source-interferometer distance, the size and spectral width of the X-ray source. The calculations show that the proposed set-up can be used as a phase-contrast microscope using laboratory hard X-ray sources.
Ultrathin optical limiters are needed to protect light sensitive components in miniaturized optical systems. However, it has proven challenging to achieve a sufficiently low optical limiting threshold. In this work, we theoretically show that an ultrathin optical limiter with low threshold intensity can be realized using a nonlinear zone plate. The zone plate is embedded with nonlinear saturable absorbing materials that allow the device to focus low intensity light, while high intensity light is transmitted as a plane wave without a focal spot. Based on this proposed mechanism, we use the finite-difference time-domain method to computationally design a zone plate embedded with InAs quantum dots as the saturable absorbing material. The device has a thickness of just 0.5 $mu m$ and exhibits good optical limiting behavior with a threshold intensity as low as 0.45 kW/$cm^2$, which is several orders of magnitude lower than current ultrathin flat-optics-based optical limiters. This design can be optimized for different operating wavelengths and threshold intensities by using different saturable absorbing materials. Additionally, the diameter and focal length of the nonlinear zone plate can be easily adjusted to fit different systems and applications. Due to its flexible design, low power threshold, and ultrathin thickness, this optical limiting concept may be promising for application in miniaturized optical systems.
Knowledge gained through X-ray crystallography fostered structural determination of materials and greatly facilitated the development of modern science and technology in the past century. Atomic details of sample structures is achievable by X-ray crystallography, however, it is only applied to crystalline structures. Imaging techniques based on X-ray coherent diffraction or zone plates are capable of resolving the internal structure of non-crystalline materials at nanoscales, but it is still a challenge to achieve atomic resolution. Here we demonstrate a novel lensless Fourier-transform ghost imaging method with pseudo-thermal hard X-rays by measuring the second-order intensity correlation function of the light. We show that high resolution Fourier-transform diffraction pattern of a complex amplitude sample can be achieved at Fresnel region and the amplitude and phase distributions of a sample in spatial domain can be retrieved successfully. The method of lensless X-ray Fourier-transform ghost imaging extends X-ray crystallography to non-crystalline samples, and its spatial resolution is limited only by the wavelength of the X-ray, thus atomic resolution should be routinely obtainable. Since highly coherent X-ray source is not required, comparing to conventional X-ray coherent diffraction imaging, the method can be implemented with laboratory X-ray sources, and it also provides a potential solution for lensless diffraction imaging with fermions, such as neutron and electron where the intensive coherent source usually is not available.
Diffractive zone plate optics uses a thin micro-structure pattern to alter the propagation direction of the incoming light wave. It has found important applications in extreme-wavelength imaging where conventional refractive lenses do not exist. The resolution limit of zone plate optics is determined by the smallest width of the outermost zone. In order to improve the achievable resolution, significant efforts have been devoted to the fabrication of very small zone width with ultrahigh placement accuracy. Here, we report the use of a diffractometer setup for bypassing the resolution limit of zone plate optics. In our prototype, we mounted the sample on two rotation stages and used a low-resolution binary zone plate to relay the sample plane to the detector. We then performed both in-plane and out-of-plane sample rotations and captured the corresponding raw images. The captured images were processed using a Fourier ptychographic procedure for resolution improvement. The final achievable resolution of the reported setup is not determined by the smallest width structures of the employed binary zone plate; instead, it is determined by the maximum angle of the out-of-plane rotation. In our experiment, we demonstrated 8-fold resolution improvement using both a resolution target and a titanium dioxide sample. The reported approach may be able to bypass the fabrication challenge of diffractive elements and open up new avenues for microscopy with extreme wavelengths.
A combination of spatial interference patterns and spectral interferometry are used to find the global phase for non-collinear two-dimensional Fourier-transform (2DFT) spectra. Results are compared with those using the spectrally resolved transient absorption (STRA) method to find the global phase when excitation is with co-linear polarization. Additionally cross-linear polarized 2DFT spectra are correctly phased using the all-optical technique, where the SRTA is not applicable.
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