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Register a new userBypassing the resolution limit of diffractive zone plate optics via rotational Fourier ptychography
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Diffractive zone plate optics uses a thin micro-structure pattern to alter the propagation direction of the incoming light wave. It has found important applications in extreme-wavelength imaging where conventional refractive lenses do not exist. The resolution limit of zone plate optics is determined by the smallest width of the outermost zone. In order to improve the achievable resolution, significant efforts have been devoted to the fabrication of very small zone width with ultrahigh placement accuracy. Here, we report the use of a diffractometer setup for bypassing the resolution limit of zone plate optics. In our prototype, we mounted the sample on two rotation stages and used a low-resolution binary zone plate to relay the sample plane to the detector. We then performed both in-plane and out-of-plane sample rotations and captured the corresponding raw images. The captured images were processed using a Fourier ptychographic procedure for resolution improvement. The final achievable resolution of the reported setup is not determined by the smallest width structures of the employed binary zone plate; instead, it is determined by the maximum angle of the out-of-plane rotation. In our experiment, we demonstrated 8-fold resolution improvement using both a resolution target and a titanium dioxide sample. The reported approach may be able to bypass the fabrication challenge of diffractive elements and open up new avenues for microscopy with extreme wavelengths.
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As a promising lensless imaging method for distance objects, intensity interferometry imaging (III) had been suffering from the unreliable phase retrieval process, hindering the development of III for decades. Recently, the introduction of the ptychographic detection in III overcame this challenge, and a method called ptychographic III (PIII) was proposed. We here experimentally demonstrate that PIII can image a dynamic distance object. A reasonable image for the moving object can be retrieved with only two speckle patterns for each probe, and only 10 to 20 iterations are needed. Meanwhile, PIII exhibits robust to the inaccurate information of the probe. Furthermore, PIII successfully recovers the image through a fog obfuscating the imaging light path, under which a conventional camera relying on lenses fails to provide a recognizable image.
All-reflective interferometry based on nano-structured diffraction gratings offers new possibilities for gravitational wave detection. We investigate an all-reflective Fabry-Perot interferometer concept in 2nd order Littrow mount. The input-output relations for such a resonator are derived treating the grating coupler by means of a scattering matrix formalism. A low loss dielectric reflection grating has been designed and manufactured to test the properties of such a grating cavity.
Raman microscopy is a valuable tool for detecting physical and chemical properties of a sample material. When probing nanomaterials or nanocomposites the spatial resolution of Raman microscopy is not always adequate as it is limited by the optical diffraction limit. Numerical post-processing with super-resolution algorithms provides a means to enhance resolution and can be straightforwardly applied. The aim of this work is to present interior-point least squares (IPLS) as a powerful tool for super-resolution in Raman imaging through constrained optimisation. IPLSs potential for super-resolution is illustrated on numerically generated test images. Its resolving power is demonstrated on Raman spectroscopic data of a polymer nanowire sample. Comparison to AFM data of the same sample substantiates that the presented method is a promising technique for analysing nanomaterial samples.
This work presents a new super-resolution imaging approach by using subwavelength hole resonances. We employ a subwavelength structure in which an array of tiny holes are etched in a metallic slab with the neighboring distance $ell$ that is smaller than half of the wavelength. By tuning the incident wave at resonant frequencies, the subwavelength structure generates strong illumination patterns that are able to probe both low and high spatial frequency components of the imaging sample sitting above the structure. The image of the sample is obtained by performing stable numerical reconstruction from the far-field measurement of the diffracted wave. It is demonstrated that a resolution of $ell/2$ can be obtained for reconstructed images, thus one can achieve super-resolution by arranging multiple holes within one wavelength. The proposed approach may find applications in wave-based imaging such as electromagnetic and ultrasound imaging. It attains two advantages that are important for practical realization. It avoids the difficulty to control the distance the between the probe and the sample surface with high precision. In addition, the numerical reconstructed images are very stable against noise by only using the low frequency band of the far-field data in the numerical reconstruction.
Strict requirements were imposed on the sizes of testing sample in the previously suggested scheme of hard X-ray Fourier-transform holography based on a two-block Fresnel zone plate interferometer with common optical axis. The failure of these requirements leads to appearance of noise in the reconstructed image. In this work, the mechanism of noise formation, as well as possibility of its suppression are considered.
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