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Register a new userUnconditional violation of the shot noise limit in photonic quantum metrology
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Interferometric phase measurement is widely used to precisely determine quantities such as length, speed, and material properties. Without quantum correlations, the best phase sensitivity $Deltavarphi$ achievable using $n$ photons is the shot noise limit (SNL), $Deltavarphi=1/sqrt{n}$. Quantum-enhanced metrology promises better sensitivity, but despite theoretical proposals stretching back decades, no measurement using photonic (i.e. definite photon number) quantum states has truly surpassed the SNL. Rather, all such demonstrations --- by discounting photon loss, detector inefficiency, or other imperfections --- have considered only a subset of the photons used. Here, we use an ultra-high efficiency photon source and detectors to perform unconditional entanglement-enhanced photonic interferometry. Sampling a birefringent phase shift, we demonstrate precision beyond the SNL without artificially correcting our results for loss and imperfections. Our results enable quantum-enhanced phase measurements at low photon flux and open the door to the next generation of optical quantum metrology advances.
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Photonic sensors have many applications in a range of physical settings, from measuring mechanical pressure in manufacturing to detecting protein concentration in biomedical samples. A variety of sensing approaches exist, and plasmonic systems in particular have received much attention due to their ability to confine light below the diffraction limit, greatly enhancing sensitivity. Recently, quantum techniques have been identified that can outperform classical sensing methods and achieve sensitivity below the so-called shot-noise limit. Despite this significant potential, the use of definite photon number states in lossy plasmonic systems for further improving sensing capabilities is not well studied. Here, we investigate the sensing performance of a plasmonic interferometer that simultaneously exploits the quantum nature of light and its electromagnetic field confinement. We show that, despite the presence of loss, specialised quantum resources can provide improved sensitivity and resolution beyond the shot-noise limit within a compact plasmonic device operating below the diffraction limit.
Quantum Metrology is one of the most promising application of quantum technologies. The aim of this research field is the estimation of unknown parameters exploiting quantum resources, whose application can lead to enhanced performances with respect to classical strategies. Several physical quantum systems can be employed to develop quantum sensors, and photonic systems represent ideal probes for a large number of metrological tasks. Here we review the basic concepts behind quantum metrology and then focus on the application of photonic technology for this task, with particular attention to phase estimation. We describe the current state of the art in the field in terms of platforms and quantum resources. Furthermore, we present the research area of multiparameter quantum metrology, where multiple parameters have to be estimated at the same time. We conclude by discussing the current experimental and theoretical challenges, and the open questions towards implementation of photonic quantum sensors with quantum-enhanced performances in the presence of noise.
The displacement of micro-electro-mechanical-systems (MEMS) cantilevers is used to measure a broad variety of phenomena in devices ranging from force microscopes to biochemical sensors to thermal imaging systems. We demonstrate the first direct measurement of a MEMS cantilever displacement with a noise floor at 40% of the shot noise limit (SNL). By combining multi-spatial-mode quantum light sources with a simple differential measurement, we show that sub-SNL MEMS displacement sensitivity is highly accessible compared to previous efforts that measured the displacement of macroscopic mirrors with very distinct spatial structures crafted with multiple optical parametric amplifiers and locking loops. These results support a new class of quantum MEMS sensor with an ultimate signal to noise ratio determined by quantum correlations, enabling ultra-trace sensing, imaging, and microscopy applications in which signals were previously obscured by shot noise.
The discrimination of coherent states is a key task in optical communication and quantum key distribution protocols. In this work, we use a photon-number-resolving detector, the transition-edge sensor, to discriminate binary-phase-shifted coherent states at a telecom wavelength. Owing to its dynamic range and high efficiency, we achieve a bit error probability that unconditionally exceeds the standard quantum limit (SQL) by up to 7.7 dB. The improvement to the SQL persists for signals containing up to approximately seven photons on average and is achieved in a single shot (i.e. without measurement feedback), thus making our approach compatible with larger bandwidths.
We provide efficient and intuitive tools for deriving bounds on achievable precision in quantum enhanced metrology based on the geometry of quantum channels and semi-definite programming. We show that when decoherence is taken into account, the maximal possible quantum enhancement amounts generically to a constant factor rather than quadratic improvement. We apply these tools to derive bounds for models of decoherence relevant for metrological applications including: dephasing,depolarization, spontaneous emission and photon loss.
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