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The metrology system of the VLTI instrument GRAVITY

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 Added by Magdalena Lippa
 Publication date 2016
  fields Physics
and research's language is English




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The VLTI instrument GRAVITY combines the beams from four telescopes and provides phase-referenced imaging as well as precision-astrometry of order 10 microarcseconds by observing two celestial objects in dual-field mode. Their angular separation can be determined from their differential OPD (dOPD) when the internal dOPDs in the interferometer are known. Here, we present the general overview of the novel metrology system which performs these measurements. The metrology consists of a three-beam laser system and a homodyne detection scheme for three-beam interference using phase-shifting interferometry in combination with lock-in amplifiers. Via this approach the metrology system measures dOPDs on a nanometer-level.



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GRAVITY is an adaptive optics assisted Beam Combiner for the second generation VLTI instrumentation. The instrument will provide high-precision narrow-angle astrometry and phase-referenced interferometric imaging in the astronomical K-band for faint objects. We describe the wide range of science that will be tackled with this instrument, highlighting the unique capabilities of the VLTI in combination with GRAVITY. The most prominent goal is to observe highly relativistic motions of matter close to the event horizon of Sgr A*, the massive black hole at center of the Milky Way. We present the preliminary design that fulfils the requirements that follow from the key science drivers: It includes an integrated optics, 4-telescope, dual feed beam combiner operated in a cryogenic vessel; near-infrared wavefrontsensing adaptive optics; fringe-tracking on secondary sources within the field of view of the VLTI and a novel metrology concept. Simulations show that 10 {mu}as astrometry within few minutes is feasible for a source with a magnitude of mK = 15 like Sgr A*, given the availability of suitable phase reference sources (mK = 10). Using the same setup, imaging of mK = 18 stellar sources in the interferometric field of view is possible, assuming a full night of observations and the corresponding UV coverage of the VLTI.
GRAVITY is the second generation VLT Interferometer (VLTI) instrument for high-precision narrow-angle astrometry and phase-referenced interferometric imaging. The laser metrology system of GRAVITY is at the heart of its astrometric mode, which must measure the distance of 2 stars with a precision of 10 micro-arcseconds. This means the metrology has to measure the optical path difference between the two beam combiners of GRAVITY to a level of 5 nm. The metrology design presents some non-common paths that have consequently to be stable at a level of 1 nm. Otherwise they would impact the performance of GRAVITY. The various tests we made in the past on the prototype give us hints on the components responsible for this error, and on their respective contribution to the total error. It is however difficult to assess their exact origin from only OPD measurements, and therefore, to propose a solution to this problem. In this paper, we present the results of a semi-empirical modeling of the fibered metrology system, relying on theoretical basis, as well as on characterisations of key components. The modeling of the metrology system regarding various effects, e.g., temperature, waveguide heating or mechanical stress, will help us to understand how the metrology behave. The goals of this modeling are to 1) model the test set-ups and reproduce the measurements (as a validation of the modeling), 2) determine the origin of the non-common path errors, and 3) propose modifications to the current metrology design to reach the required 1nm stability.
235 - Florentin Millour 2018
In this paper we present the most promising science cases for a new generation visible instrument on the VLTI and the conceptual idea for the instrumental configuration. We also present a statistical study of the potential targets that may be accessible for the different classes of objects and for the required spectral resolutions.
GRAVITY is a second generation VLTI instrument, combining the light of four telescopes and two objects simultaneously. The main goal is to obtain astrometrically accurate information. Besides correctly measured stellar phases this requires the knowledge of the instrumental differential phase, which has to be measured optically during the astronomical observations. This is the purpose of a dedicated metrology system. The GRAVITY metrology covers the full optical path, from the beam combiners up to the reference points in the beam of the primary telescope mirror, minimizing the systematic uncertainties and providing a proper baseline in astrometric terms. Two laser beams with a fixed phase relation travel backward the whole optical chain, creating a fringe pattern in any plane close to a pupil. By temporal encoding the phase information can be extracted at any point by means of flux measurements with photo diodes. The reference points chosen sample the pupil at typical radii, eliminating potential systematics due differential focus. We present the final design and the performance estimate, which is in accordance with the overall requirements for GRAVITY.
452 - M. Lippa , N. Blind , S. Gillessen 2015
The VLTI instrument GRAVITY will provide very powerful astrometry by combining the light from four telescopes for two objects simultaneously. It will measure the angular separation between the two astronomical objects to a precision of 10 microarcseconds. This corresponds to a differential optical path difference (dOPD) between the targets of few nanometers and the paths within the interferometer have to be maintained stable to that level. For this purpose, the novel metrology system of GRAVITY will monitor the internal dOPDs by means of phase-shifting interferometry. We present the four-step phase-shifting concept of the metrology with emphasis on the method used for calibrating the phase shifts. The latter is based on a phase-step insensitive algorithm which unambiguously extracts phases in contrast to other methods that are strongly limited by non-linearities of the phase-shifting device. The main constraint of this algorithm is to introduce a robust ellipse fitting routine. Via this approach we are able to measure phase shifts in the laboratory with a typical accuracy of lambda/2000 or 1 nanometer of the metrology wavelength.
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