No Arabic abstract
Gate operations in a quantum information processor are generally realized by tailoring specific periods of free and driven evolution of a quantum system. Unwanted environmental noise, which may in principle be distinct during these two periods, acts to decohere the system and increase the gate error rate. While there has been significant progress characterizing noise processes during free evolution, the corresponding driven-evolution case is more challenging as the noise being probed is also extant during the characterization protocol. Here we demonstrate the noise spectroscopy (0.1 - 200 MHz) of a superconducting flux qubit during driven evolution by using a robust spin-locking pulse sequence to measure relaxation (T1rho) in the rotating frame. In the case of flux noise, we resolve spectral features due to coherent fluctuators, and further identify a signature of the 1MHz defect in a time-domain spin-echo experiment. The driven-evolution noise spectroscopy complements free-evolution methods, enabling the means to characterize and distinguish various noise processes relevant for universal quantum control.
We present a technique to measure the transfer function of a control line using a qubit as a vector network analyzer. Our method requires coupling the line under test to the the longitudinal component of the Hamiltonian of the qubit and the ability to induce Rabi oscillations through simultaneous driving of the transversal component. We used this technique to characterize the flux control of a superconducting Transmon qubit in the range of 8 to 400,MHz. Our method can be used for the qubit flux line calibration to increase the fidelity of entangling gates for the quantum processor. The qubit can be also used as a microscopic probe of the electro-magnetic fields on a chip.
We investigate the relaxation of a superconducting qubit for the case when its detector, the Josephson bifurcation amplifier, remains latched in one of its two (meta)stable states of forced vibrations. The qubit relaxation rates are different in different states. They can display strong dependence on the qubit frequency and resonant enhancement, which is due to quasienergy resonances. Coupling to the driven oscillator changes the effective temperature of the qubit.
The promise of quantum computing with imperfect qubits relies on the ability of a quantum computing system to scale cheaply through error correction and fault-tolerance. While fault-tolerance requires relatively mild assumptions about the nature of qubit errors, the overhead associated with coherent and non-Markovian errors can be orders of magnitude larger than the overhead associated with purely stochastic Markovian errors. One proposal to address this challenge is to randomize the circuits of interest, shaping the errors to be stochastic Pauli errors but leaving the aggregate computation unaffected. The randomization technique can also suppress couplings to slow degrees of freedom associated with non-Markovian evolution. Here we demonstrate the implementation of Pauli-frame randomization in a superconducting circuit system, exploiting a flexible programming and control infrastructure to achieve this with low effort. We use high-accuracy gate-set tomography to characterize in detail the properties of the circuit error, with and without the randomization procedure, which allows us to make rigorous statements about Markovianity as well as the nature of the observed errors. We demonstrate that randomization suppresses signatures of non-Markovian evolution to statistically insignificant levels, from a Markovian model violation ranging from $43sigma$ to $1987sigma$, down to violations between $0.3sigma$ and $2.7sigma$ under randomization. Moreover, we demonstrate that, under randomization, the experimental errors are well described by a Pauli error model, with model violations that are similarly insignificant (between $0.8sigma$ and $2.7sigma$). Importantly, all these improvements in the model accuracy were obtained without degradation to fidelity, and with some improvements to error rates as quantified by the diamond norm.
We study the backaction of a driven nonlinear resonator on a multi-level superconducting qubit. Using unitary transformations on the multi-level Jaynes-Cummings Hamiltonian and quantum optics master equation, we derive an analytical model that goes beyond linear response theory. Within the limits of validity of the model, we obtain quantitative agreement with experimental and numerical data, both in the bifurcation and in the parametric amplification regimes of the nonlinear resonator. We show in particular that the measurement-induced dephasing rate of the qubit can be rather small at high drive power. This is in contrast to measurement with a linear resonator where this rate increases with the drive power. Finally, we show that, for typical parameters of circuit quantum electrodynamics, correctly describing measurement-induced dephasing requires a model going beyond linear response theory, such as the one presented here.
Superconducting qubits are a leading candidate for quantum computing but display temporal fluctuations in their energy relaxation times T1. This introduces instabilities in multi-qubit device performance. Furthermore, autocorrelation in these time fluctuations introduces challenges for obtaining representative measures of T1 for process optimization and device screening. These T1 fluctuations are often attributed to time varying coupling of the qubit to defects, putative two level systems (TLSs). In this work, we develop a technique to probe the spectral and temporal dynamics of T1 in single junction transmons by repeated T1 measurements in the frequency vicinity of the bare qubit transition, via the AC-Stark effect. Across 10 qubits, we observe strong correlations between the mean T1 averaged over approximately nine months and a snapshot of an equally weighted T1 average over the Stark shifted frequency range. These observations are suggestive of an ergodic-like spectral diffusion of TLSs dominating T1, and offer a promising path to more rapid T1 characterization for device screening and process optimization.