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Register a new userA transposed frequency technique for phase noise and frequency stability measurements
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The digital signal processing has greatly simplified the process of phase noise measurements, especially in oscillators, but its applications are largely confined to the frequencies below 400 MHz. We propose a novel transpose frequency technique, which extends the frequency range of digital noise measurements to the microwave domain and beyond. We discuss two basic variations of the proposed noise measurement technique, one of which enables characterization of phase fluctuations added to the passing signal by the particular microwave component, for example by an amplifier, while another one is intended for measurements of phase fluctuations of the incoming signal itself.
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We describe the use of digital phase noise test sets at frequencies well beyond the sampling rate of their analog-to-digital converters. The technique proposed involves the transfer of phase fluctuations from an arbitrary high carrier frequency to within the operating frequency range of the digital instrument. The validity of the proposed technique has been proven via comparison with conventional methods. Digital noise measurements eliminate the need for calibration and improve consistency of experimental results. Mechanisms limiting the resolution of spectral measurements are also discussed.
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We theoretically and experimentally study the noise of a class-A dual-frequency vertical external cavity surface emitting laser operating at Cesium clock wavelength. The intensity noises of the two orthogonally polarized modes and the phase noise of their beatnote are investigated. The intensity noises of the two modes and their correlations are well predicted by a theory based on coupled rate equations. The phase noise of the beatnote is well described by considering both thermal effects and the effect of phase-amplitude coupling. The good agreement between theory and experiment indicates possible ways to further decrease the laser noises.
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Radio-frequency reflectometry of nanodevices requires careful separation of signal quadratures to distinguish dissipative and dispersive contributions to the device impedance. A tunable phase shifter for this purpose is described and characterized. The phase shifter, consisting of a varactor-loaded transmission line, has the necessary tuning range combined with acceptable insertion loss across a frequency band 100 MHz - 1 GHz spanning most radio-frequency experiments. Its operation is demonstrated by demodulating separately the signals due to resistance and capacitance changes in a model device.
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