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Register a new userReduction of heating rate in a microfabricated ion trap by pulsed-laser cleaning
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Laser-cleaning of the electrodes in a planar micro-fabricated ion trap has been attempted using ns pulses from a tripled Nd:YAG laser at 355nm. The effect of the laser pulses at several energy density levels has been tested by measuring the heating rate of a single 40Ca+ trapped ion as a function of its secular frequency. A reduction of the electric-field noise spectral density by ~50% has been observed and a change in the frequency dependence also noticed. This is the first reported experiment where the anomalous heating phenomenon has been reduced by removing the source as opposed to reducing its thermal driving by cryogenic cooling. This technique may open the way to better control of the electrode surface quality in ion microtraps.
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We characterise the performance of a surface-electrode ion chip trap fabricated using established semiconductor integrated circuit and micro-electro-mechanical-system (MEMS) microfabrication processes which are in principle scalable to much larger ion trap arrays, as proposed for implementing ion trap quantum information processing. We measure rf ion micromotion parallel and perpendicular to the plane of the trap electrodes, and find that on-package capacitors reduce this to <~ 10 nm in amplitude. We also measure ion trapping lifetime, charging effects due to laser light incident on the trap electrodes, and the heating rate for a single trapped ion. The performance of this trap is found to be comparable with others of the same size scale.
Anomalous motional heating is a major obstacle to scalable quantum information processing with trapped ions. While the source of this heating is not yet understood, several previous studies suggest that surface contaminants may be largely responsible. We demonstrate an improvement by a factor of four in the room-temperature heating rate of a niobium surface electrode trap by in situ plasma cleaning of the trap surface. This surface treatment was performed with a simple homebuilt coil assembly and commercially-available matching network and is considerably gentler than other treatments, such as ion milling or laser cleaning, that have previously been shown to improve ion heating rates. We do not see an improvement in the heating rate when the trap is operated at cryogenic temperatures, pointing to a role of thermally-activated surface contaminants in motional heating whose activity may freeze out at low temperatures.
The prospect of building a quantum information processor underlies many recent advances ion trap fabrication techniques. Potentially, a quantum computer could be constructed from a large array of interconnected ion traps. We report on a micrometer-scale ion trap, fabricated from bulk silicon using micro-electromechanical systems (MEMS) techniques. The trap geometry is relatively simple in that the electrodes lie in a single plane beneath the ions. In such a trap we confine laser-cooled 24Mg+ ions approximately 40 microns above the surface. The fabrication technique and planar electrode geometry together make this approach amenable to scaling up to large trap arrays. In addition we observe that little laser cooling light is scattered by the electrodes.
Anomalous heating of trapped atomic ions is a major obstacle to their use as quantum bits in a scalable quantum computer. The physical origin of this heating is not fully understood, but experimental evidence suggests that it is caused by electric-field noise emanating from the surface of the trap electrodes. In this study, we have investigated the role that adsorbates on the electrodes play by identifying contaminant overlayers, developing an in situ argon-ion beam cleaning procedure, and measuring ion heating rates before and after cleaning the trap electrodes surfaces. We find a reduction of two orders of magnitude in heating rate after cleaning.
The advent of microfabricated ion traps for the quantum information community has allowed research groups to build traps that incorporate an unprecedented number of trapping zones. However, as device complexity has grown, the number of digital-to-analog converter (DAC) channels needed to control these devices has grown as well, with some of the largest trap assemblies now requiring nearly one hundred DAC channels. Providing electrical connections for these channels into a vacuum chamber can be bulky and difficult to scale beyond the current numbers of trap electrodes. This paper reports on the development and testing of an in-vacuum DAC system that uses only 9 vacuum feedthrough connections to control a 78-electrode microfabricated ion trap. The system is characterized by trapping single and multiple $^{40}$Ca$^+$ ions. The measured axial mode stability, ion heating rates, and transport fidelities for a trapped ion are comparable to systems with external(air-side) commercial DACs.
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