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Register a new userScanning probe microscopy of thermally excited mechanical modes of an optical microcavity
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Added by
Tobias Kippenberg Jan
Publication date
2006
fields
Physics
and research's language is
English
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The resonant buildup of light within optical microcavities elevates the radiation pressure which mediates coupling of optical modes to the mechanical modes of a microcavity. Above a certain threshold pump power, regenerative mechanical oscillation occurs causing oscillation of certain mechanical eigenmodes. Here, we present a methodology to spatially image the micro-mechanical resonances of a toroid microcavity using a scanning probe technique. The method relies on recording the induced frequency shift of the mechanical eigenmode when in contact with a scanning probe tip. The method is passive in nature and achieves a sensitivity sufficient to spatially resolve the vibrational mode pattern associated with the thermally agitated displacement at room temperature. The recorded mechanical mode patterns are in good qualitative agreement with the theoretical strain fields as obtained by finite element simulations.
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The theoretical work of V.B. Braginsky predicted that radiation pressure can couple the mechanical, mirror-eigenmodes of a Fabry-Perot resonator to its optical modes, leading to a parametric oscillation instability. This regime is characterized by regenerative mechanical oscillation of the mechanical mirror eigenmodes. We have recently observed the excitation of mechanical modes in an ultra-high-Q optical microcavity. Here, we present a detailed experimental analysis of this effect and demonstrate that radiation pressure is the excitation mechanism of the observed mechanical oscillations.
Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a samples topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties with high-resolution has gained much popularity in recent years with advances in dynamic AFM methodologies. A calibration factor is required to convert the electrical readout to a mechanical oscillation amplitude in order to extract quantitative information about the surface. We propose a new calibration technique for the oscillation amplitude of electrically driven probes, which is based on measuring the electrical energy input to maintain the oscillation amplitude constant. We demonstrate the application of the new technique with quartz tuning fork including the qPlus configuration, while the same principle can be applied to other piezoelectric resonators such as length extension resonators, or piezoelectric cantilevers. The calibration factor obtained by this technique is found to be in agreement with using thermal noise spectrum method for capsulated, decapsulated tuning forks and tuning forks in the qPlus configuration.
Two-dimensional van der Waals (vdW) crystals can sustain various types of polaritons with strong electromagnetic confinements, making them highly attractive for the nanoscale photonic and optoelectronic applications. While extensive experimental and numerical studies are devoted to the polaritons of the vdW crystals, analytical models are sparse. Particularly, applying such a model to describe the polariton behaviors visualized by state-of-art near-field optical microscopy requires further investigation. Herein, we develop an analytical waveguide model to describe the polariton propagations in vdW crystals. The dispersion contours, dispersion relations, and electromagnetic field distributions of different polariton waveguide modes are derived. The model is verified by near-field optical imaging and numerical simulation of phonon polaritons in the {alpha}-MoO3, a typical vdW biaxial crystals. The model can be extended to other types of polaritons in vdW crystals, thus allowing for describing and understanding their localized electromagnetic behaviors analytically.
This paper presents multiple-modes Scanning Probe Microscopy (SPM) studies on characterize resistance switching (RS), polarization rotation (PO) and surface potential changes in copper doped ZnO (ZnO:Cu) thin films. The bipolar RS behavior is confirmed by conductive Atomic Force Microscopy (c-AFM). The PO with almost 180{deg} phase angle is confirmed by using the vertical and lateral Piezoresponse Force Microscopy (PFM). In addition, it elucidates that obvious polarization rotation behavior can be observed in the sample with increasing Cu concentration. Furthermore, correlation of the RS behavior with PO behavior has been studied by performing various mode SPM measurements on the same location. The electric field resulted from the opposite polarization orientation are corresponded to the different resistance states. It is found that the region with the polarization in downward direction has low resistance state (LRS), whereas the region with upward polarization has high resistance state (HRS). In addition, the Piezoresponse Force Spectroscopy (PFS) and Switching Spectroscopy PFM (SS-PFM) measurements further confirm that the existence of the built-in field due to the uncomplemented polarization may affect the depletion region and hence contribute to the RS behavior. In addition, Kelvin Probe Force Microscopy (KPFM) results show that, when ZnO-based thin films is subjected to negative and then followed by positive sample bias, injection charge limit current is dominated.
The finite-difference time-domain (FDTD) method is employed to solve the three dimensional Maxwell equation for the situation of near-field microscopy using a sub-wavelength aperture. Experimental result on unexpected high spatial resolution is reproduced by our computer simulation.
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