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Register a new userX-Ray diffraction studies on asymmetrically broadened peaks of heavily deformed Zirconium based alloys
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The diffraction peaks of Zircaloy-2 and Zr-2.5%Nb alloys at various deformations are found to be asymmetric in nature. In order to characterize the microstructure from these asymmetric peaks of these deformed alloys, X-Ray Diffraction Line Profile Analysis like Williamson-Hall technique, Variance method based on second and fourth order restricted moments and Stephens model based on anisotropic strain distribution have been adopted. The domain size and dislocation density have been evaluated as a function of deformation for both these alloys. These techniques are useful where the dislocation structure is highly inhomogeneous inside the matrix causing asymmetry in the line profile, particularly for deformed polycrystalline materials.
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The mechanism of the evolution of the deformed microstructure at the earliest stage of annealing where the existence of the lowest length scale substructure paves the way to the formation of the so-called subgrains, has been studied for the first time. The study has been performed at high temperature on heavily deformed Ti-modified austenitic stainless steel using X-ray diffraction technique. Significant changes were observed in the values of the domain size, both with time and temperature. Two different types of mechanism have been proposed to be involved during the microstructural evolution at the earliest stages of annealing. The nature of the growth of domains with time at different temperatures has been modelled using these mechanisms. High-resolution transmission electron microscopy has been used to view the microstructure of the deformed and annealed sample and the results have been corroborated successfully with those found from the X-ray diffraction techniques.
Two sets of amorphous carbon materials prepared at different routes are irradiated with swift (145 MeV) heavy ion (Ne6+). The structural parameters like the size of ordered grains along c and a axis i.e. Lc & La, the average spacing of the crystallographic planes (002) i.e. d002 and the fraction of the amorphous phase of the unirradiated and the irradiated samples are estimated by X-ray diffraction technique. The fraction of the amorphous phase is generally found to increase with the irradiation dose for both sets of the samples. The estimated and values are found to be almost unaffected by irradiation. The estimated values of corroborate with the increase of disorder in both sets of the samples with the increasing dose of irradiation. Keywords: X-ray Diffraction, Amorphous Carbon, Irradiation
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