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Register a new userStudies on Neon irradiated amorphous carbon using X-ray Diffraction technique
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Added by
Parthasarathi Barat
Publication date
2005
fields
Physics
and research's language is
English
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Two sets of amorphous carbon materials prepared at different routes are irradiated with swift (145 MeV) heavy ion (Ne6+). The structural parameters like the size of ordered grains along c and a axis i.e. Lc & La, the average spacing of the crystallographic planes (002) i.e. d002 and the fraction of the amorphous phase of the unirradiated and the irradiated samples are estimated by X-ray diffraction technique. The fraction of the amorphous phase is generally found to increase with the irradiation dose for both sets of the samples. The estimated and values are found to be almost unaffected by irradiation. The estimated values of corroborate with the increase of disorder in both sets of the samples with the increasing dose of irradiation. Keywords: X-ray Diffraction, Amorphous Carbon, Irradiation
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The microstructural parameters like the average domain size, effective domain size at a particular crystallographic direction and microstrain within the domains of titanium and Ti-5%Ta-2%Nb, irradiated with 116 MeV O5+ ion, have been characterized as a function of dose by X-Ray Diffraction Line Profile Analysis using different model based approaches. Dislocation Density and stacking fault probabilities have also been estimated from the analysis. The analysis revealed that there was a significant decrease of the average domain size with dose as compared to the unirradiated sample. The estimated values of dislocation density increased significantly for the irradiated samples and was found to be an order of magnitude more as compared to the unirradiated one. However, the dislocation density saturated with increase in dose. The deformation (stacking) fault probabilities were found to be negligible even with the increase in dose of irradiation.
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Determination of lattice misfit and microstructural parameters of the coherent precipitates in Ni based alloy Inconel-625 is a challenging problem as their peaks are completely overlapping among themselves and also with the matrix. We have used a novel X-ray diffraction technique on the bulk samples of Inconel 625 at different heat-treated conditions to determine the lattice parameters, the lattice misfit of the coherent precipitates with the matrix and their microstructural parameters like size and strain.
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The diffraction peaks of Zircaloy-2 and Zr-2.5%Nb alloys at various deformations are found to be asymmetric in nature. In order to characterize the microstructure from these asymmetric peaks of these deformed alloys, X-Ray Diffraction Line Profile Analysis like Williamson-Hall technique, Variance method based on second and fourth order restricted moments and Stephens model based on anisotropic strain distribution have been adopted. The domain size and dislocation density have been evaluated as a function of deformation for both these alloys. These techniques are useful where the dislocation structure is highly inhomogeneous inside the matrix causing asymmetry in the line profile, particularly for deformed polycrystalline materials.
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