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Register a new userDisorder Potentials near Lithographically Fabricated Atom Chips
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We show that previously observed large disorder potentials in magnetic microtraps for neutral atoms are reduced by about two orders of magnitude when using atom chips with lithographically fabricated high quality gold layers. Using one dimensional Bose-Einstein condensates, we probe the remaining magnetic field variations at surface distances down to a few microns. Measurements on a 100 um wide wire imply that residual variations of the current flow result from local properties of the wire.
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Atoms can be trapped and guided using nano-fabricated wires on surfaces, achieving the scales required by quantum information proposals. These Atom Chips form the basis for robust and widespread applications of cold atoms ranging from atom optics to fundamental questions in mesoscopic physics, and possibly quantum information systems.
Silicon immersion gratings and grisms enable compact, near-infrared spectrographs with high throughput. These instruments find use in ground-based efforts to characterize stellar and exoplanet atmospheres, and in space-based observatories. Our grating fabrication technique uses x-ray crystallography to orient silicon parts prior to cutting, followed by lithography and wet chemical etching to produce the blaze. This process takes advantage of the crystal structure and relative difference in etching rates between the (100) and (111) planes such that we can produce parts that have surface errors < {lambda}/4. Previous measurements indicate that chemical etching can yield a final etched blaze that slightly differs from the orientation of the (111) plane. This difference can be corrected by the mechanical mount in the case of the immersion gratings, but doing so may compromise grating throughput due to shadowing. In the case of the grisms, failure to take the actual blaze into account will reduce the brightness of the undeviated ray. We report on multiple techniques to precisely measure the blaze of our in-house fabricated immersion gratings. The first method uses a scanning electron microscope to image the blaze profile, which yields a measurement precision of 0.5 degrees. The second method is an optical method of measuring the angle between blaze faces using a rotation stage, which yields a measurement precision of 0.2 degrees. Finally, we describe a theoretical blaze function modeling method, which we expect to yield a measurement precision of 0.1 degrees. With these methods, we can quantify the accuracy with which the wet etching produces the required blaze and further optimize grating and grism efficiencies.
Magnetic microtraps and Atom Chips are safe, small-scale, reliable and flexible tools to prepare ultra-cold and degenerate atom clouds as sources for various atom-optical experiments. We present an overview of the possibilities of the devices and indicate how a microtrap can be used to prepare and launch a Bose-Einstein condensate for use in an atom clock or an interferometer.
Surface based geometries of microfabricated wires or patterned magnetic films can be used to magnetically trap and manipulate ultracold neutral atoms or Bose-Einstein condensates. We investigate the magnetic properties of such atom chips using a scanning magnetoresistive (MR) microscope with high spatial resolution and high field sensitivity. We show that MR sensors are ideally suited to observe small variations of the magnetic field caused by imperfections in the wires or magnetic materials which ultimately lead to fragmentation of ultracold atom clouds. Measurements are also provided for the magnetic field produced by a thin current-carrying wire with small geometric modulations along the edge. Comparisons of our measurements with a full numeric calculation of the current flow in the wire and the subsequent magnetic field show excellent agreement. Our results highlight the use of scanning MR microscopy as a convenient and powerful technique for precisely characterizing the magnetic fields produced near the surface of atom chips.
We report on the integration of small-scale optical components into silicon wafers for use in atom chips. We present an on-chip fibre-optic atom detection scheme that can probe clouds with small atom numbers. The fibres can also be used to generate microscopic dipole traps. We describe our most recent results with optical microcavities and show that single-atom detection can be realised on an atom chip. The key components have been fabricated by etching directly into the atom chip silicon substrate.
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