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Register a new userLoOp: Looking for Optimal Hard Negative Embeddings for Deep Metric Learning
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Added by
Bhavya Vasudeva
Publication date
2021
fields
Informatics Engineering
and research's language is
English
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Deep metric learning has been effectively used to learn distance metrics for different visual tasks like image retrieval, clustering, etc. In order to aid the training process, existing methods either use a hard mining strategy to extract the most informative samples or seek to generate hard synthetics using an additional network. Such approaches face different challenges and can lead to biased embeddings in the former case, and (i) harder optimization (ii) slower training speed (iii) higher model complexity in the latter case. In order to overcome these challenges, we propose a novel approach that looks for optimal hard negatives (LoOp) in the embedding space, taking full advantage of each tuple by calculating the minimum distance between a pair of positives and a pair of negatives. Unlike mining-based methods, our approach considers the entire space between pairs of embeddings to calculate the optimal hard negatives. Extensive experiments combining our approach and representative metric learning losses reveal a significant boost in performance on three benchmark datasets.
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In this paper, we present a novel deep metric learning method to tackle the multi-label image classification problem. In order to better learn the correlations among images features, as well as labels, we attempt to explore a latent space, where images and labels are embedded via two unique deep neural networks, respectively. To capture the relationships between image features and labels, we aim to learn a emph{two-way} deep distance metric over the embedding space from two different views, i.e., the distance between one image and its labels is not only smaller than those distances between the image and its labels nearest neighbors, but also smaller than the distances between the labels and other images corresponding to the labels nearest neighbors. Moreover, a reconstruction module for recovering correct labels is incorporated into the whole framework as a regularization term, such that the label embedding space is more representative. Our model can be trained in an end-to-end manner. Experimental results on publicly available image datasets corroborate the efficacy of our method compared with the state-of-the-arts.
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