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Register a new userMulti defect detection and analysis of electron microscopy images with deep learning
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Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalable to large numbers of images or real-time analysis. In this work, we discuss the application of machine learning approaches to find the location and geometry of different defect clusters in irradiated steels. We show that a deep learning based Faster R-CNN analysis system has a performance comparable to human analysis with relatively small training data sets. This study proves the promising ability to apply deep learning to assist the development of automated microscopy data analysis even when multiple features are present and paves the way for fast, scalable, and reliable analysis systems for massive amounts of modern electron microscopy data.
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For the sake of recognizing and classifying textile defects, deep learning-based methods have been proposed and achieved remarkable success in single-label textile images. However, detecting multi-label defects in a textile image remains challenging due to the coexistence of multiple defects and small-size defects. To address these challenges, a multi-level, multi-attentional deep learning network (MLMA-Net) is proposed and built to 1) increase the feature representation ability to detect small-size defects; 2) generate a discriminative representation that maximizes the capability of attending the defect status, which leverages higher-resolution feature maps for multiple defects. Moreover, a multi-label object detection dataset (DHU-ML1000) in textile defect images is built to verify the performance of the proposed model. The results demonstrate that the network extracts more distinctive features and has better performance than the state-of-the-art approaches on the real-world industrial dataset.
Videos captured using Transmission Electron Microscopy (TEM) can encode details regarding the morphological and temporal evolution of a material by taking snapshots of the microstructure sequentially. However, manual analysis of such video is tedious, error-prone, unreliable, and prohibitively time-consuming if one wishes to analyze a significant fraction of frames for even videos of modest length. In this work, we developed an automated TEM video analysis system for microstructural features based on the advanced object detection model called YOLO and tested the system on an in-situ ion irradiation TEM video of dislocation loops formed in a FeCrAl alloy. The system provides analysis of features observed in TEM including both static and dynamic properties using the YOLO-based defect detection module coupled to a geometry analysis module and a dynamic tracking module. Results show that the system can achieve human comparable performance with an F1 score of 0.89 for fast, consistent, and scalable frame-level defect analysis. This result is obtained on a real but exceptionally clean and stable data set and more challenging data sets may not achieve this performance. The dynamic tracking also enabled evaluation of individual defect evolution like per defect growth rate at a fidelity never before achieved using common human analysis methods. Our work shows that automatically detecting and tracking interesting microstructures and properties contained in TEM videos is viable and opens new doors for evaluating materials dynamics.
In the deep metric learning approach to image segmentation, a convolutional net densely generates feature vectors at the pixels of an image. Pairs of feature vectors are trained to be similar or different, depending on whether the corresponding pixels belong to same or different ground truth segments. To segment a new image, the feature vectors are computed and clustered. Both empirically and theoretically, it is unclear whether or when deep metric learning is superior to the more conventional approach of directly predicting an affinity graph with a convolutional net. We compare the two approaches using brain images from serial section electron microscopy images, which constitute an especially challenging example of instance segmentation. We first show that seed-based postprocessing of the feature vectors, as originally proposed, produces inferior accuracy because it is difficult for the convolutional net to predict feature vectors that remain uniform across large objects. Then we consider postprocessing by thresholding a nearest neighbor graph followed by connected components. In this case, segmentations from a metric graph turn out to be competitive or even superior to segmentations from a directly predicted affinity graph. To explain these findings theoretically, we invoke the property that the metric function satisfies the triangle inequality. Then we show with an example where this constraint suppresses noise, causing connected components to more robustly segment a metric graph than an unconstrained affinity graph.
Water quality has a direct impact on industry, agriculture, and public health. Algae species are common indicators of water quality. It is because algal communities are sensitive to changes in their habitats, giving valuable knowledge on variations in water quality. However, water quality analysis requires professional inspection of algal detection and classification under microscopes, which is very time-consuming and tedious. In this paper, we propose a novel multi-target deep learning framework for algal detection and classification. Extensive experiments were carried out on a large-scale colored microscopic algal dataset. Experimental results demonstrate that the proposed method leads to the promising performance on algal detection, class identification and genus identification.
We apply high resolution scanning tunneling microscopy to study intrinsic defect states of bulk FeSe. Four types of intrinsic defects including the type I dumbbell, type II dumbbell, top-layer Se vacancy and inner-layer Se-site defect are extensively analyzed by scanning tunneling spectroscopy. From characterized depression and enhancement of density of states measured in a large energy range, the type I dumbbell and type II dumbbell are determined to be the Fe vacancy and Se$_mathrm{Fe}$ defect, respectively. The top-layer Se vacancy and possible inner-layer Se-site vacancy are also determined by spectroscopy analysis. The determination of defects are compared and largely confirmed in the annular dark-field scanning transmission electron microscopy measurement of the exfoliated FeSe. The detailed mapping of defect states in our experiment lays the foundation for a comparison with complex theoretical calculations in the future.
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