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Register a new userSilicon heterojunction solar cells explored via noise spectroscopy: spatial selectivity and the influence of a-Si passivating layers
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We have employed state-of-the-art cross-correlation noise spectroscopy to study carrier dynamics in silicon heterojunction solar cells, complimented by SENTARUS simulations of the same devices. These cells were composed of a light absorbing n-doped crystalline silicon layer contacted by passivating layers of i-a-Si:H and doped a-Si:H electrode layers. The method provided a two-orders-of-magnitude improved sensitivity and allowed to resolution of three additional contributions to noise in addition to 1/f noise. We have observed shot noise with Fano factor close to unity. We have also observed a peculiar generation-recombination term, which presents only under light illumination with energy above 2 eV and thus reflects light absorption and carrier trapping in the a-Si:H layers. A second, low-frequency generation-recombination term was detected at temperatures below 100 K. We argue that it appears because the process of charge carrier transfer across i-a-Si:H occurs via an intermediate defect limited by tunneling above about 100 K and a thermally assisted process below this temperature. We also discuss the spatial selectivity of noise spectroscopy, namely the tendency of the method to amplify noise contributions from the most resistive element of the cell. Indeed, in our case, all three terms are linked to the passivating i-a-Si:H layer.
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Silicon heterojunction (SHJ) solar cells represent a promising technological approach towards higher photovoltaics efficiencies and lower fabrication cost. While the device physics of SHJ solar cells have been studied extensively in the past, the ways in which nanoscopic electronic processes such as charge-carrier generation, recombination, trapping, and percolation affect SHJ device properties macroscopically have yet to be fully understood. We report the study of atomic scale current percolation at state-of-the-art a-Si:H/c-Si heterojunction solar cells under ambient operating conditions, revealing the profound complexity of electronic SHJ interface processes. Using conduction atomic force microscopy (cAFM), it is shown that the macroscopic current-voltage characteristics of SHJ solar cells is governed by the average of local nanometer-sized percolation pathways associated with bandtail states of the doped a-Si:H selective contact leading to above bandgap open circuit voltages ($V_{mbox{OC}}$) as high as 1.2 V ($V_{mbox{OC}}>e E_{mbox{gap}}^{mbox{Si}}$). This is not in violation of photovoltaic device physics but a consequence of the nature of nanometer-scale charge percolation pathways which originate from trap-assisted tunneling causing dark leakage current. We show that the broad distribution of local photovoltage is a direct consequence of randomly trapped charges at a-Si:H dangling bond defects which lead to strong local potential fluctuations and induce random telegraph noise of the dark current.
We investigate nongeminate recombination in organic solar cells based on copper phthalocyanine (CuPc) and C$_{60}$. Two device architectures, the planar heterojunction (PHJ) and the bulk heterojunction (BHJ), are directly compared in view of differences in charge carrier decay dynamics. We apply a combination of transient photovoltage (TPV) experiments, yielding the small perturbation charge carrier lifetime, and charge extraction measurements, providing the charge carrier density. In organic solar cells, charge photogeneration and recombination primarily occur at the donor--acceptor heterointerface. Whereas the BHJ can often be approximated by an effective medium due to rather small scale phase separation, the PHJ has a well defined two-dimensional heterointerface. To study recombination dynamics in PHJ devices most relevant is the charge accumulation at this interface. As from extraction techniques only the spatially averaged carrier concentration can be determined, we derive the charge carrier density at the interface $n_{int}$ from the open circuit voltage. Comparing the experimental results with macroscopic device simulation we discuss the differences of recombination and charge carrier densities in CuPc:C$_{60}$ PHJ and BHJ devices with respect to the device performance. The open circuit voltage of BHJ is larger than for PHJ at low light intensities, but at 0.3 sun the situation is reversed: here, the PHJ can finally take advantage of its generally longer charge carrier lifetimes, as the active recombination region is smaller.
Practical device architectures are proposed here for the implementation of three-terminal heterojunction bipolar transistor solar cells (3T-HBTSCs). These photovoltaic devices, which have a potential efficiency similar to that of multijunction cells, exhibit reduced spectral sensitivity compared with monolithically and series-connected tandem solar cells. In addition, the simplified n-p-n (or p-n-p) structure does not require the use of tunnel junctions. In this framework, four architectures are proposed and discussed in this paper: 1) one in which the top cell is based on silicon and the bottom cell is based on a heterojunction between silicon and III-V nanomaterials; 2) one in which the top cell is made of amorphous silicon and the bottom cell is made of an amorphous silicon-silicon heterojunction; 3) one based on the use of III-V semiconductors aimed at space applications; and 4) one in which the top cell is based on a perovskite material and the bottom cell is made of a perovskite-silicon heterostructure.
A quite general device analysis method that allows the direct evaluation of optical and recombination losses in crystalline silicon (c-Si)-based solar cells has been developed. By applying this technique, the optical and physical limiting factors of the state-of-the-art solar cells with ~20% efficiencies have been revealed. In the established method, the carrier loss mechanisms are characterized from the external quantum efficiency (EQE) analysis with very low computational cost. In particular, the EQE analyses of textured c-Si solar cells are implemented by employing the experimental reflectance spectra obtained directly from the actual devices while using flat optical models without any fitting parameters. We find that the developed method provides almost perfect fitting to EQE spectra reported for various textured c-Si solar cells, including c-Si heterojunction solar cells, a dopant-free c-Si solar cell with a MoOx layer, and an n-type passivated emitter with rear locally diffused (PERL) solar cell. The modeling of the recombination loss further allows the extraction of the minority carrier diffusion length and surface recombination velocity from the EQE analysis. Based on the EQE analysis results, the carrier loss mechanisms in different types of c-Si solar cells are discussed.
Solution-processed intrinsic ZnO and Al doped ZnO (ZnO:Al) were spin coated on textured n-type c-Si wafer to replace the phosphorus doped amorphous silicon as the electron selective transport layer (ESTL) of the Si heterojunction (SHJ) solar cells. Besides the function of electron selective transportation, the non-doped ZnO was found to possess certain passivation effect on c-Si wafer. The SHJ solar cells with different combinations of passivation layer (intrinsic a-Si:H, SiOx and non-doped ZnO) and electron transport layer (non-doped ZnO and ZnO:Al ) were fabricated and compared. An efficiency up to 18.46% was achieved on a SHJ solar cell with an a-Si:H/ZnO:Al double layer back structure. And, the all solution-processed non-doped ZnO/ZnO:Al combination layer presents fairly good electron selective transportation property for SHJ solar cell, resulting in an efficiency of 17.13%. The carrier transport based on energy band diagrams of the rear side of the solar cells has been discussed related to the performance of the SHJ solar cells.
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