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Register a new userRevisiting RowHammer: An Experimental Analysis of Modern DRAM Devices and Mitigation Techniques
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Jeremie Kim
Publication date
2020
fields
Informatics Engineering
and research's language is
English
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In order to shed more light on how RowHammer affects modern and future devices at the circuit-level, we first present an experimental characterization of RowHammer on 1580 DRAM chips (408x DDR3, 652x DDR4, and 520x LPDDR4) from 300 DRAM modules (60x DDR3, 110x DDR4, and 130x LPDDR4) with RowHammer protection mechanisms disabled, spanning multiple different technology nodes from across each of the three major DRAM manufacturers. Our studies definitively show that newer DRAM chips are more vulnerable to RowHammer: as device feature size reduces, the number of activations needed to induce a RowHammer bit flip also reduces, to as few as 9.6k (4.8k to two rows each) in the most vulnerable chip we tested. We evaluate five state-of-the-art RowHammer mitigation mechanisms using cycle-accurate simulation in the context of real data taken from our chips to study how the mitigation mechanisms scale with chip vulnerability. We find that existing mechanisms either are not scalable or suffer from prohibitively large performance overheads in projected future devices given our observed trends of RowHammer vulnerability. Thus, it is critical to research more effective solutions to RowHammer.
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It has become increasingly difficult to understand the complex interaction between modern applications and main memory, composed of DRAM chips. Manufacturers are now selling and proposing many different types of DRAM, with each DRAM type catering to different needs (e.g., high throughput, low power, high memory density). At the same time, the memory access patterns of prevalent and emerging workloads are rapidly diverging, as these applications manipulate larger data sets in very different ways. As a result, the combined DRAM-workload behavior is often difficult to intuitively determine today, which can hinder memory optimizations in both hardware and software. In this work, we identify important families of workloads, as well as prevalent types of DRAM chips, and rigorously analyze the combined DRAM--workload behavior. To this end, we perform a comprehensive experimental study of the interaction between nine different DRAM types and 115 modern applications and multiprogrammed workloads. We draw 12 key observations from our characterization, enabled in part by our development of new metrics that take into account contention between memory requests due to hardware design. Notably, we find that (1) newer DRAM types such as DDR4 and HMC often do not outperform older types such as DDR3, due to higher access latencies and, in the case of HMC, poor exploitation of locality; (2) there is no single DRAM type that can cater to all components of a heterogeneous system (e.g., GDDR5 significantly outperforms other memories for multimedia acceleration, while HMC significantly outperforms other memories for network acceleration); and (3) there is still a strong need to lower DRAM latency, but unfortunately the current design trend of commodity DRAM is toward higher latencies to obtain other benefits. We hope that the trends we identify can drive optimizations in both hardware and software design.
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This paper summarizes our work on experimental characterization and analysis of reduced-voltage operation in modern DRAM chips, which was published in SIGMETRICS 2017, and examines the works significance and future potential. We take a comprehensive approach to understanding and exploiting the latency and reliability characteristics of modern DRAM when the DRAM supply voltage is lowered below the nominal voltage level specified by DRAM standards. We perform an experimental study of 124 real DDR3L (low-voltage) DRAM chips manufactured recently by three major DRAM vendors. We find that reducing the supply voltage below a certain point introduces bit errors in the data, and we comprehensively characterize the behavior of these errors. We discover that these errors can be avoided by increasing the latency of three major DRAM operations (activation, restoration, and precharge). We perform detailed DRAM circuit simulations to validate and explain our experimental findings. We also characterize the various relationships between reduced supply voltage and error locations, stored data patterns, DRAM temperature, and data retention. Based on our observations, we propose a new DRAM energy reduction mechanism, called Voltron. The key idea of Voltron is to use a performance model to determine by how much we can reduce the supply voltage without introducing errors and without exceeding a user-specified threshold for performance loss. Our evaluations show that Voltron reduces the average DRAM and system energy consumption by 10.5% and 7.3%, respectively, while limiting the average system performance loss to only 1.8%, for a variety of memory-intensive quad-core workloads. We also show that Voltron significantly outperforms prior dynamic voltage and frequency scaling mechanisms for DRAM.
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