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Register a new userSpeckle-based determination of the polarisation state of single and multiple laser beams
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Laser speckle is generated by the multiple interference of light through a disordered medium. Here we study the premise that the speckle pattern retains information about the polarisation state of the incident field. We analytically verify that a linear relation exists between the Stokes vector of the light and the resulting speckle pattern. As a result, the polarisation state of a beam can be measured from the speckle pattern using a transmission matrix approach. We perform a quantitative analysis of the accuracy of the transmission matrix method to measure randomly time-varying polarisation states. In experiment, we find that the Stokes parameters of light from a diode laser can be retrieved with an uncertainty of 0.05 using speckle images of 150$times$150 pixels and 17 training states. We show both analytically and in experiment that this approach may be extended to the case of more than one laser field, demonstrating the measurement of the Stokes parameters of two laser beams simultaneously from a single speckle pattern and achieving the same uncertainty of 0.05.
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Laser speckle can provide a powerful tool that may be used for metrology, for example measurements of the incident laser wavelength with a resolution beyond that which may be achieved in a commercial device. However, to realise highest resolution requires advanced multi-variate analysis techniques, which limit the acquisition rate of such a wavemeter. Here we show an arithmetically simple method to measure wavelength changes with dynamic speckle, based on a Poincar`e descriptor of the speckle pattern. We demonstrate the measurement of wavelength changes at femtometer-level with a measurement time reduced by two orders of magnitude compared to the previous state-of-the-art, which offers promise for applications such as speckle-based laser wavelength stabilisation.
Many areas of optical science require an accurate measurement of optical spectra. Devices based on laser speckle promise compact wavelength measurement, with attometer-level sensitivity demonstrated for single wavelength laser fields. The measurement of multimode spectra using this approach would be attractive, yet this is currently limited to picometer resolution. Here, we present a method to improve the resolution and precision of speckle-based multi-wavelength measurements. We measure multiple wavelengths simultaneously, in a device comprising a single 1 m-long step-index multimode fiber and a fast camera. Independent wavelengths separated by as little as 1 fm are retrieved with 0.2 fm precision using Principal Component Analysis. The method offers a viable way to measure sparse spectra containing multiple individual lines and is likely to find application in the tracking of multiple lasers in fields such as portable quantum technologies and optical telecommunications.
Enhancement cavities where a beam of large size (several millimeters) can resonate have several applications, in particular in atomic physics. However, reaching large beam waists in a compact geometry (less than a meter long) typically brings the resonator close to the degeneracy limit. Here we experimentally study a degenerate optical cavity, 44-cm long and consisting of two flat mirrors placed in the focal planes of a lens, in a regime of intermediate finesse ($sim 150$). We study the impact of the longitudinal misalignement on the optical gain, for different input beam waists up to 5.6~mm, and find data consistent with the prediction of a model based on ABCD propagation of Gaussian beams. We reach an optical gain of 26 for a waist of 1.4~mm, which can have an impact on several applications, in particular atom interferometry. We numerically investigate the optical gain reduction for large beam waists using the angular spectrum method to consider the effects of optical aberrations, which play an important role in such a degenerate cavity. Our calculations quantitatively reproduce the experimental data and will provide a key tool for designing enhancement cavities close to the degeneracy limit. As an illustration, we discuss the application of this resonator geometry to the enhancement of laser beams with top-hat intensity profiles.
Coherent diffraction imaging (CDI) using synchrotron radiation, X-ray free electron lasers (X-FELs), high harmonic generation, soft X-ray lasers, and optical lasers has found broad applications across several disciplines. An active research direction in CDI is to determine the structure of single particles with intense, femtosecond X-FEL pulses based on diffraction-before-destruction scheme. However, single-shot 3D structure determination has not been experimentally realized yet. Here we report the first experimental demonstration of single-shot 3D structure determination of individual nanocrystals using ~10 femtosecond X-FEL pulses. Coherent diffraction patterns are collected from high-index-faceted nanocrystals, each struck by a single X-FEL pulse. Taking advantage of the symmetry of the nanocrystal, we reconstruct the 3D structure of each nanocrystal from a single-shot diffraction pattern at ~5.5 nm resolution. As symmetry exists in many nanocrystals and virus particles, this method can be applied to 3D structure studies of such particles at nanometer resolution on femtosecond time scales.
Synchronising ultra-short (~fs) and focussed laser pulses is a particularly difficult task, as this timescale lies orders of magnitude below the typical range of fast electronic devices. Here we present an optical technique that allows for femtosecond-scale synchronisation of the focal planes of two focussed laser pulses. This technique is virtually applicable to any focussing geometry and relative intensity of the two lasers. Experimental implementation of this technique provides excellent quantitative agreement with theoretical expectations. The proposed technique will prove highly beneficial for the next generation of multiple, petawatt class laser systems.
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