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Register a new userSoft proton scattering at grazing incidence from X-ray mirrors: analysis of experimental data in the framework of the non-elastic approximation
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Astronomical X-ray observatories with grazing incidence optics face the problem of pseudo-focusing of low energy protons from the mirrors towards the focal plane. Those protons constitute a variable, unpredictable component of the non X-ray background that strongly affects astronomical observations and a correct estimation of their flux at the focal plane is then essential. For this reason, we investigate how they are scattered from the mirror surfaces when impacting with grazing angles. We compare the non-elastic model of reflectivity of particles at grazing incidence proposed by Remizovich et al. (1980) with the few available experimental measurements of proton scattering from X-ray mirrors. We develop a semi-empirical analytical model based on the fit of those experimental data with the Remizovich solution. We conclude that the scattering probability weakly depends on the energy of the impinging protons and that the relative energy losses are necessary to correctly model the data. The model we propose assumes no dependence on the incident energy and can be implemented in particle transport simulation codes to generate, for instance, proton response matrices for specific X-ray missions. Further laboratory measurements at lower energies and on other mirror samples, such as ATHENA Silicon Pore Optics, will improve the resolution of the model and will allow us to build the proper proton response matrices for a wider sample of X-ray observatories.
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The optics of a number of future X-ray telescopes will have very long focal lengths (10 - 20 m), and will consist of a number of nested/stacked thin, grazing-incidence mirrors. The optical quality characterization of a real mirror can be obtained via profile metrology, and the Point Spread Function of the mirror can be derived via one of the standard computation methods. However, in practical cases it can be difficult to access the optical surfaces of densely stacked mirror shells, after they have been assembled, using the widespread metrological tools. For this reason, the assessment of the imaging resolution of a system of mirrors is better obtained via a direct, full-illumination test in X-rays. If the focus cannot be reached, an intra-focus test can be performed, and the image can be compared with the simulation results based on the metrology, if available. However, until today no quantitative information was extracted from a full-illumination, intra-focal exposure. In this work we show that, if the detector is located at an optimal distance from the mirror, the intensity variations of the intra-focal, full-illumination image in single reflection can be used to reconstruct the profile of the mirror surface, without the need of a wavefront sensor. The Point Spread Function can be subsequently computed from the reconstructed mirror shape. We show the application of this method to an intra-focal (8 m distance from mirror) test performed at PANTER on an optical module prototype made of hot-slumped glass foils with a 20 m focal length, from which we could derive an expected imaging quality near 16 arcsec HEW.
In-orbit experience has shown that soft protons are funneled more efficiently through focusing Wolter-type optics of X-ray observatories than simulations predicted. These protons can degrade the performance of solid-state X-ray detectors and contribute to the instrumental background. Since laboratory measurements of the scattering process are rare, an experiment for grazing angles has been set up at the accelerator facility of the University of Tubingen. Systematic measurements at incidence angles ranging from 0.3{deg} to 1.2{deg} with proton energies around 250 keV, 500 keV, and 1 MeV have been carried out. Parts of spare mirror shells of the eROSITA (extended ROentgen Survey with an Imaging Telescope Array) instrument have been used as scattering targets. This publication comprises a detailed description of the setup, the calibration and normalization methods, and the scattering efficiency and energy loss results. A comparison of the results with a theoretical scattering description and with simulations is included as well.
Future hard X-ray telescopes (e.g. SIMBOL-X and Constellation-X) will make use of hard X-ray optics with multilayer coatings, with angular resolutions comparable to the achieved ones in the soft X-rays. One of the crucial points in X-ray optics, indeed, is multilayer interfacial microroughness that causes effective area reduction and X-Ray Scattering (XRS). The latter, in particular, is responsible for image quality degradation. Interfacial smoothness deterioration in multilayer deposition processes is commonly observed as a result of substrate profile replication and intrinsic random deposition noise. For this reason, roughness growth should be carefully investigated by surface topographic analysis, X-ray reflectivity and XRS measurements. It is convenient to express the roughness evolution in terms of interface Power Spectral Densities (PSD), that are directly related to XRS and, in turn, in affecting the optic HEW (Half Energy Width). In order to interpret roughness amplification and to help us to predict the imaging performance of hard X-ray optics, we have implemented a well known kinetic continuum equation model in a IDL language program (MPES, Multilayer PSDs Evolution Simulator), allowing us the determination of characteristic growth parameters in multilayer coatings. In this paper we present some results from analysis we performed on several samples coated with hard X-ray multilayers (W/Si, Pt/C, Mo/Si) using different deposition techniques. We show also the XRS predictions resulting from the obtained modelizations, in comparison to the experimental XRS measurements performed at the energy of 8.05 keV.
We have developed an experimental system to simultaneously observe surface structure, morphology, composition, chemical state, and chemical activity for samples in gas phase environments. This is accomplished by simultaneously measuring X-ray photoelectron spectroscopy (XPS) and grazing incidence X-ray scattering (GIXS) in gas pressures as high as the multi-Torr regime, while also recording mass spectrometry. Scattering patterns reflect near-surface sample structures from the nano- to the meso-scale. The grazing incidence geometry provides tunable depth sensitivity while scattered X-rays are detected across a broad range of angles using a newly designed pivoting-UHV-manipulator for detector positioning. At the same time, XPS and mass spectrometry can be measured, all from the same sample spot and in ambient conditions. To demonstrate the capabilities of this system, we measured the chemical state, composition, and structure of Ag-behenate on a Si(001) wafer in vacuum and in O$_2$ atmosphere at various temperatures. These simultaneous structural, chemical, and gas phase product probes enable detailed insights into the interplay between structure and chemical state for samples in gas phase environments. The compact size of our pivoting-UHV-manipulator makes it possible to retrofit this technique into existing spectroscopic instruments installed at synchrotron beamlines. Because many synchrotron facilities are planning or undergoing upgrades to diffraction limited storage rings with transversely coherent beams, a newly emerging set of coherent X-ray scattering experiments can greatly benefit from the concepts we present here.
Grazing incidence x-ray surface scattering has been used to investigate liquid surfaces down to the molecular scale. The free surface of water is well described by the capillary wave model (<z(q)z(-q)> ~ q-2 spectrum) up to wavevectors > 10^8 m^-1. At larger wavevectors near-surface acoustic waves must be taken into account. When the interface is bounded by a surfactant monolayer, it exhibits a bending stiffness and the bending rigidity modulus can be measured. However, bending effects generally cannot be described using the Helfrich Hamiltonian and the characteristic exponent in the roughness power spectrum can smaller than 4. Finally, upon compression, tethered monolayers formed on a subphase containing divalent ions are shown to buckle in the third dimension with a characteristic wavelength on the order of 10^8 m^-1.
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