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Thin film superconducting quantum interferometer with ultralow inductance

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 Added by Valentin Koverya
 Publication date 2018
  fields Physics
and research's language is English




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A simple method has been developed for manufacturing a thin film superconducting quantum interferometer (SQI) with ultralow inductance (~10^-13 H). Current-voltage and voltage-field characteristics of the SQI are presented. The basic design equations are obtained and confirmed experimentally. The SQI has been used for the first time to determine the penetration depth of a magnetic field into a film of 50% In-50% Sn alloy.



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