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Register a new userBright sub-20 nm cathodoluminescent nanoprobes for multicolor electron microscopy
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Electron microscopy (EM) has been instrumental in our understanding of biological systems ranging from subcellular structures to complex organisms. Although EM reveals cellular morphology with nanoscale resolution, it does not provide information on the location of proteins within a cellular context. An EM-based bioimaging technology capable of localizing individual proteins and resolving protein-protein interactions with respect to cellular ultrastructure would provide important insights into the molecular biology of a cell. Here, we report on the development of luminescent nanoprobes potentially suitable for labeling biomolecules in a multicolor EM modality. In this approach, the labels are based on lanthanide-doped nanoparticles that emit light under electron excitation in a process known as cathodoluminescence (CL). Our results suggest that the optimization of nanoparticle composition, synthesis protocols and electron imaging conditions could enable high signal-to-noise localization of biomolecules with a sub-20-nm resolution, limited only by the nanoparticle size. In ensemble measurements, these luminescent labels exhibit narrow spectra of nine distinct colors that are characteristic of the corresponding rare-earth dopant type.
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The progress of semiconductor electronics toward ever-smaller length scales and associated higher power densities brings a need for new high-resolution thermal microscopy techniques. Traditional thermal microscopy is performed by detecting infrared radiation with far-field optics, where the resolution is limited by the wavelength of the light. By adopting a serial, local-probe approach, near-field and scanned-probe microscopies can surpass this limit but sacrifice imaging speed. In the same way that electron microscopy was invented to overcome the resolution limits of light microscopy, we here demonstrate a thermal imaging technique that uses an electron microscope to overcome the limits of infrared thermal microscopy, without compromising imaging speed. With this new technique, which we call electron thermal microscopy, temperature is resolved by detecting the liquid-solid transition of arrays of nanoscale islands, producing thermal maps in real-time (30 thermal images per second over a 16um^2 field-of-view). The experimental demonstration is supported by combined electrical and thermal modeling.
With rapidly growing photoconversion efficiencies, hybrid perovskite solar cells have emerged as promising contenders for next generation, low-cost photovoltaic technologies. Yet, the presence of nanoscale defect clusters, that form during the fabrication process, remains critical to overall device operation, including efficiency and long-term stability. To successfully deploy hybrid perovskites, we must understand the nature of the different types of defects, assess their potentially varied roles in device performance, and understand how they respond to passivation strategies. Here, by correlating photoemission and synchrotron-based scanning probe X-ray microscopies, we unveil three different types of defect clusters in state-of-the-art triple cation mixed halide perovskite thin films. Incorporating ultrafast time-resolution into our photoemission measurements, we show that defect clusters originating at grain boundaries are the most detrimental for photocarrier trapping, while lead iodide defect clusters are relatively benign. Hexagonal polytype defect clusters are only mildly detrimental individually, but can have a significant impact overall if abundant in occurrence. We also show that passivating defects with oxygen in the presence of light, a previously used approach to improve efficiency, has a varied impact on the different types of defects. Even with just mild oxygen treatment, the grain boundary defects are completely healed, while the lead iodide defects begin to show signs of chemical alteration. Our findings highlight the need for multi-pronged strategies tailored to selectively address the detrimental impact of the different defect types in hybrid perovskite solar cells.
Sub-100 nm nanomagnets not only are technologically important, but also exhibit complex magnetization reversal behaviors as their dimensions are comparable to typical magnetic domain wall widths. Here we capture magnetic fingerprints of 1 billion Fe nanodots as they undergo a single domain to vortex state transition, using a first-order reversal curve (FORC) method. As the nanodot size increases from 52 nm to 67 nm, the FORC diagrams reveal striking differences, despite only subtle changes in their major hysteresis loops. The 52 nm nanodots exhibit single domain behavior and the coercivity distribution extracted from the FORC distribution agrees well with a calculation based on the measured nanodot size distribution. The 58 and 67 nm nanodots exhibit vortex states, where the nucleation and annihilation of the vortices are manifested as butterfly-like features in the FORC distribution and confirmed by micromagnetic simulations. Furthermore, the FORC method gives quantitative measures of the magnetic phase fractions, and vortex nucleation and annihilation fields.
Manipulating materials at the nanometer scale is challenging, particularly if alignment with nanoscale electrodes is desired. Here we describe a lithography-free, self-aligned nanotrench ablation (SANTA) technique to create nanoscale trenches in a polymer like poly(methyl) methacrylate (PMMA). The nanotrenches are self-aligned with carbon nanotube (CNT) and graphene ribbon electrodes through a simple Joule heating process. Using simulations and experiments we investigate how the Joule power, ambient temperature, PMMA thickness, and substrate properties can improve the spatial resolution of this technique. We achieve sub-20 nm nanotrenches for the first time, by lowering the ambient temperature and reducing the PMMA thickness. We also demonstrate a functioning nanoscale resistive memory (RRAM) bit self-aligned with a CNT control device, achieved through the SANTA approach. This technique provides an elegant and inexpensive method to probe nanoscale devices using self-aligned electrodes, without the use of conventional alignment or lithography steps.
Glass nanopipettes are widely used for various applications in nanosciences. In most of the applications, it is important to characterize their geometrical parameters, such as the aperture size and the inner cone angle at the tip region. For nanopipettes with sub-10 nm aperture and thin wall thickness, transmission electron microscopy (TEM) must be most instrumental in their precise geometrical measurement. However, this measurement has remained a challenge because heat generated by electron beam irradiation would largely deform sub-10-nm nanopipettes. Here we provide methods for preparing TEM specimens that do not cause deformation of such tiny nanopipettes.
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