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A simple photoionization scheme for characterizing electron and ion spectrometers

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 Added by Marcel Mudrich Dr.
 Publication date 2017
  fields Physics
and research's language is English




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We present a simple diode laser-based photoionization scheme for generating electrons and ions with well-defined spatial and energetic (<2 eV) structures. This scheme can easily be implemented into ion or electron imaging spectrometers for the purpose of off-line characterization and calibration. The low laser power ~1$ mW needed from a passively stabilized diode laser and the low flux of potassium atoms in an effusive beam make our scheme a versatile source of ions and electrons for applications in research and education.

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In this Letter, we report a demonstration of ion and electron ghost imaging. Two beams of correlated ions and electrons are produced by a photoionization process and accelerated into opposite directions. Using a single time and position sensitive detector for one beam, we can image an object seen by the other beam even when the detector that sees this object has no spatial resolution. The extra information given by this second detector can, therefore, be used to reconstruct the image thanks to the correlation between the ions and the electrons. In our example, a metallic mask placed in front of a time-sensitive detector is used as the object to image. We demonstrated ion and electron ghost imaging using this mask in a transmission mode. These primary results are very promising and open applications especially in ion and electron imaging in surface science and nanophysics.
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Significant systematic errors in high-precision Penning trap mass spectrometry can result from electric and magnetic field imperfections. An experimental procedure to minimize these uncertainties is presented for the on-line Penning trap mass spectrometer ISOLTRAP, located at ISOLDE/CERN. The deviations from the ideal magnetic and electric fields are probed by measuring the cyclotron frequency and the reduced cyclotron frequency, respectively, of stored ions as a function of the time between the ejection of ions from the preparation trap and their capture in the precision trap, which influences the energy of their axial motion. The correction parameters are adjusted to minimize the frequency shifts.
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