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Register a new userQuenching current by flux-flow instability in iron-chalcogenides thin films
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The stability against quench is one of the main issue to be pursued in a superconducting material which should be able to perform at very high levels of current densities. Here we focus on the connection between the critical current $I_c$ and the quenching current $I^*$ associated to the so-called flux-flow instability phenomenon, which sets in as an abrupt transition from the flux flow state to the normal state. To this purpose, we analyze several current-voltage characteristics of three types of iron-based thin films, acquired at different temperature and applied magnetic field values. For these samples, we discuss the impact of a possible coexistence of intrinsic electronic mechanisms and extrinsic thermal effects on the quenching current dependence upon the applied magnetic field. The differences between the quenching current and the critical current are reported also in the case of predominant intrinsic mechanisms. Carrying out a comparison with high-temperature cuprate superconductors, we suggest which material can be the best trade-off between maximum operating temperature, higher upper critical field and stability under high current bias.
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The flux flow properties of epitaxial niobium films with different pinning strengths are investigated by dc electrical resistance measurements and mapped to results derived within the framework of a theoretical model. Investigated are the cases of weak random pinning in as-grown films, strong random pinning in Ga ion-irradiated films, and strong periodic pinning induced by a nanogroove array milled by focused ion beam. The generic feature of the current-voltage curves of the films consists in instability jumps to the normal state at some instability current density $j^ast$ as the vortex lattice reaches its critical velocity $v^ast$. While $v^ast(B)$ monotonically decreases for as-grown films, the irradiated films exhibit a non-monotonic dependence $v^ast(B)$ attaining a maximum in the low-field range. In the case of nanopatterned films, this broad maximum is accompanied by a much sharper maximum in both, $v^ast(B)$ and $j^ast(B)$, which we attribute to the commensurability effect when the spacing between the vortex rows coincides with the location of the grooves. We argue that the observed behavior of $v^ast(B)$ can be explained by the pinning effect on the vortex flow instability and support our claims by fitting the experimental data to theoretical expressions derived within a model accounting for the field dependence of the depinning current density.
The improvement in the fabrication techniques of iron-based superconductors have made these materials real competitors of high temperature superconductors and MgB$_2$. In particular, iron-chalcogenides have proved to be the most promising for the realization of high current carrying tapes. But their use on a large scale cannot be achieved without the understanding of the current stability mechanisms in these compounds. Indeed, we have recently observed the presence of flux flow instabilities features in Fe(Se,Te) thin films grown on CaF$_2$. Here we present the results of current-voltage characterizations at different temperatures and applied magnetic fields on Fe(Se,Te) microbridges grown on CaF$_2$. These results will be analyzed from the point of view of the most validated models with the aim to identify the nature of the flux flow instabilities features (i.e., thermal or electronic), in order to give a further advance to the high current carrying capability of iron-chalcogenide superconductors.
Larkin and Ovchinnikov established that the viscous flow of magnetic flux quanta in current-biased superconductor films placed in a perpendicular magnetic field can lose stability due to a decrease in the vortex viscosity coefficient $eta$ with increasing velocity of the vortices $v$. The dependence of $eta$ on $v$ leads to a $nonlinear$ section in the current-voltage ($I$-$V$) curve which ends at the flux-flow instability point with a voltage jump to a highly resistive state. At the same time, in contradistinction with the nonlinear conductivity regime, instability jumps often occur in $linear$ $I$-$V$ sections. Here, for the elucidation of such jumps we develop a theory of local instability of the magnetic flux flow occurring not in the entire film but in a narrow strip across the film width in which vortices move much faster than outside it. The predictions of the developed theory are in agreement with experiments on Nb films for which the heat removal coefficients and the inelastic scattering times of quasiparticles are deduced. The presented model of local instability is also relevant for the characterization of superconducting thin films whose performance is examined for fast single-photon detection.
Measurements of the nonlinear flux-flow resistivity $rho$ and the critical vortex velocity $rm v^*_phi$ at high voltage bias close to the instability regime predicted by Larkin and Ovchinnikov cite{LO} are reported along the node and antinode directions of the d-wave order parameter in the textit{a-b} plane of epitaxial $YBa_2Cu_3O_{7-delta}$ films. In this pinning-free regime, $rho$ and $rm v^*_phi$ are found to be anisotropic with values in the node direction larger on average by 10% than in the antinode direction. The anisotropy of $rho$ is almost independent of temperature and field. We attribute the observed results to the anisotropic quasiparticle distribution on the Fermi surface of $YBa_2Cu_3O_{7-delta}$.
We present numerical and analytical studies of coupled nonlinear Maxwell and thermal diffusion equations which describe nonisothermal dendritic flux penetration in superconducting films. We show that spontaneous branching of propagating flux filaments occurs due to nonlocal magnetic flux diffusion and positive feedback between flux motion and Joule heat generation. The branching is triggered by a thermomagnetic edge instability which causes stratification of the critical state. The resulting distribution of magnetic microavalanches depends on a spatial distribution of defects. Our results are in good agreement with experiments performed on Nb films.
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