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Register a new userMeasurements of trapped-ion heating rates with exchangeable surfaces in close proximity
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Electric-field noise from the surfaces of ion-trap electrodes couples to the ions charge causing heating of the ions motional modes. This heating limits the fidelity of quantum gates implemented in quantum information processing experiments. The exact mechanism that gives rise to electric-field noise from surfaces is not well-understood and remains an active area of research. In this work, we detail experiments intended to measure ion motional heating rates with exchangeable surfaces positioned in close proximity to the ion, as a sensor to electric-field noise. We have prepared samples with various surface conditions, characterized in situ with scanned probe microscopy and electron spectroscopy, ranging in degrees of cleanliness and structural order. The heating-rate data, however, show no significant differences between the disparate surfaces that were probed. These results suggest that the driving mechanism for electric-field noise from surfaces is due to more than just thermal excitations alone.
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Electric-field noise due to surfaces disturbs the motion of nearby trapped ions, compromising the fidelity of gate operations that are the basis for quantum computing algorithms. We present a method that predicts the effect of dielectric materials on the ions motion. Such dielectrics are integral components of ion traps. Quantitative agreement is found between a model with no free parameters and measurements of a trapped ion in proximity to dielectric mirrors. We expect that this approach can be used to optimize the design of ion-trap-based quantum computers and network nodes.
Anomalous motional heating is a major obstacle to scalable quantum information processing with trapped ions. While the source of this heating is not yet understood, several previous studies suggest that surface contaminants may be largely responsible. We demonstrate an improvement by a factor of four in the room-temperature heating rate of a niobium surface electrode trap by in situ plasma cleaning of the trap surface. This surface treatment was performed with a simple homebuilt coil assembly and commercially-available matching network and is considerably gentler than other treatments, such as ion milling or laser cleaning, that have previously been shown to improve ion heating rates. We do not see an improvement in the heating rate when the trap is operated at cryogenic temperatures, pointing to a role of thermally-activated surface contaminants in motional heating whose activity may freeze out at low temperatures.
For the past two and a half decades, anomalous heating of trapped ions from nearby electrode surfaces has continued to demonstrate unexpected results. Caused by electric-field noise, this heating of the ions motional modes remains an obstacle for scalable quantum computation with trapped ions. One of the anomalous features of this electric-field noise is the reported nonmonotonic behavior in the heating rate when a trap is incrementally cleaned by ion bombardment. Motivated by this result, the present work reports on a surface analysis of a sample ion-trap electrode treated similarly with incremental doses of Ar$^+$ ion bombardment. Kelvin probe force microscopy and x-ray photoelectron spectroscopy were used to investigate how the work functions on the electrode surface vary depending on the residual contaminant coverage between each treatment. It is shown that the as-fabricated Au electrode is covered with a hydrocarbon film that is modified after the first treatment, resulting in work functions and core-level binding energies that resemble that of atomic-like carbon on Au. The change in the spatial distributions of work functions as the coverage changes with each treatment is apparently related to the nonmonotonic heating-rate behavior previously reported.
We present measurements of the motional heating rate of a trapped ion at different trap frequencies and temperatures between $sim$0.6 and 1.5 MHz and $sim$4 and 295 K. Additionally, we examine the possible effect of adsorbed surface contaminants with boiling points below $sim$105$^{circ}$C by measuring the ion heating rate before and after locally baking our ion trap chip under ultrahigh vacuum conditions. We compare the heating rates presented here to those calculated from available electric-field noise models. We can tightly constrain a subset of these models based on their expected frequency and temperature scaling interdependence. Discrepancies between the measured results and predicted values point to the need for refinement of theoretical noise models in order to more fully understand the mechanisms behind motional trapped-ion heating.
Measuring and understanding electric field noise from bulk material and surfaces is important for many areas of physics. In this work, we introduce a method to detect in situ different sources of electric field noise using a single trapped ion as a sensor. We demonstrate the probing of electric field noise as small as $S_E = 5.2(11)times 10^{-16},text{V}^2text{m}^{-2}text{Hz}^{-1}$, the lowest noise level observed with a trapped ion to our knowledge. Our setup incorporates a controllable noise source utilizing a high-temperature superconductor. This element allows us, first, to benchmark and validate the sensitivity of our probe. Second, to probe non-invasively bulk properties of the superconductor, observing for the first time a superconducting transition with an ion. For temperatures below the transition, we use our setup to assess different surface noise processes. The measured noise shows a crossover regime in the frequency domain, which cannot be explained by existing surface noise models. Our results open perspectives for new models in surface science and pave the way to test them experimentally.
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