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Register a new userMultichannel scanning probe microscopy and spectroscopy of graphene moire structures
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The graphene moire structures on metals, as they demonstrate both long (moire) and short (atomic) scale ordered structures, are the ideal systems for the application of scanning probe methods. Here we present the complex studies of the graphene/Ir(111) system by means of 3D scanning tunnelling and atomic force microscopy/spectroscopy as well as Kelvin-probe force microscopy. All results clearly demonstrate a variation of the moire and atomic scale contrasts as a function of the bias voltage as well as the distance between the scanning probe and the sample, allowing to discriminate between topographic and electronic contributions in the imaging of a graphene layer on metals. The presented results are accompanied by the state-of-the-art density functional theory calculations demonstrating the excellent agreement between theoretical and experimental data.
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Moire superlattices in van der Waals heterostructures are gaining increasing attention because they offer new opportunities to tailor and explore unique electronic phenomena when stacking 2D materials with small twist angles. Here, we reveal local surface potentials associated with stacking domains in twisted double bilayer graphene (TDBG) moire superlattices. Using a combination of both lateral Piezoresponse Force Microscopy (LPFM) and Scanning Kelvin Probe Microscopy (SKPM), we distinguish between Bernal (ABAB) and rhombohedral (ABCA) stacked graphene and directly correlate these stacking configurations with local surface potential. We find that the surface potential of the ABCA domains is ~15 mV higher (smaller work function) than that of the ABAB domains. First-principles calculations based on density functional theory further show that the different work functions between ABCA and ABAB domains arise from the stacking dependent electronic structure. We show that, while the moire superlattice visualized by LPFM can change with time, imaging the surface potential distribution via SKPM appears more stable, enabling the mapping of ABAB and ABCA domains without tip-sample contact-induced effects. Our results provide a new means to visualize and probe local domain stacking in moire superlattices along with its impact on electronic properties.
Hard point-contact spectroscopy and scanning probe microscopy/spectroscopy are powerful techniques for investigating materials with strong expandability. To support these studies, tips with various physical and chemical properties are required. To ensure the reproducibility of experimental results, the fabrication of tips should be standardized, and a controllable and convenient system should be set up. Here a systematic methodology to fabricate various tips is proposed, involving electrochemical etching reactions. The reaction parameters fall into four categories: solution, power supply, immersion depth, and interruption. An etching system was designed and built so that these parameters could be accurately controlled. With this system, etching parameters for copper, silver, gold, platinum/iridium alloy, tungsten, lead, niobium, iron, nickel, cobalt, and permalloy were explored and standardized. Among these tips, silver and niobiums new recipes were explored and standardized. Optical and scanning electron microscopies were performed to characterize the sharp needles. Relevant point-contact experiments were carried out with an etched silver tip to confirm the suitability of the fabricated tips.
Epitaxial graphene grown on transition metal surfaces typically exhibits a moire pattern due to the lattice mismatch between graphene and the underlying metal surface. We use both scanning tunneling microscopy (STM) and atomic force microscopy (AFM) experiments to probe the electronic and topographic contrast of the graphene moire on the Ir(111) surface. While STM topography is influenced by the local density of states close to the Fermi energy and the local tunneling barrier height, AFM is capable of yielding the true surface topography once the background force arising from the van der Waals (vdW) interaction between the tip and the substrate is taken into account. We observe a moire corrugation of 35$pm$10 pm, where the graphene-Ir(111) distance is the smallest in the areas where the graphene honeycomb is atop the underlying iridium atoms and larger on the fcc or hcp threefold hollow sites.
We report on state-of-the-art scanning probe microscopy measurements performed in a pulse tube based top-loading closed-cycle cryostat with a base temperature of 4 K and a 9 T magnet. We decoupled the sample space from the mechanical and acoustic noise from the cryocooling system to enable scanning probe experiments. The extremely low vibration amplitudes in our system enabled successful imaging of 0.39 nm lattice steps on single crystalline SrTiO$_{3}$ as well as magnetic vortices in Bi$_{2}$Sr$_{2}$CaCu$_{2}$O$_{8+x}$ superconductor. Fine control over sample temperature and applied magnetic field further enabled us to probe the helimagnetic and the skyrmion-lattice phases in Fe$_{0.5}$Co$_{0.5}$Si with unprecedented signal-to-noise ratio of 20:1. Finally, we demonstrate for the first time quartz-crystal tuning fork shear-force microscopy in a closed-cycle cryostat.
Thermodynamics of tip-induced nanodomain formation in scanning probe microscopy of ferroelectric films and crystals is studied using the Landau-Ginzburg-Devonshire phenomenological approach. The local redistribution of polarization induced by the biased probe apex is analyzed including the effects of polarization gradients, field dependence of dielectric properties, intrinsic domain wall width, and film thickness. The polarization distribution inside subcritical nucleus of the domain preceding the nucleation event is very smooth and localized below the probe, and the electrostatic field distribution is dominated by the tip. In contrast, polarization distribution inside the stable domain is rectangular-like, and the associated electrostatic fields clearly illustrate the presence of tip-induced and depolarization field components. The calculated coercive biases of domain formation are in a good agreement with available experimental results for typical ferroelectric materials. The microscopic origin of the observed domain tip elongation in the region where the probe electric field is much smaller than the intrinsic coercive field is the positive depolarization field in front of the moving counter domain wall. For infinitely thin domain walls local domain breakdown through the sample depth appears. The results obtained here are complementary to the Landauer-Molotskii energetic approach.
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