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Register a new userScanning probe microscopy in an ultra-low vibration closed-cycle cryostat
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Added by
Francesca Paola Quacquarelli
Publication date
2014
fields
Physics
and research's language is
English
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We report on state-of-the-art scanning probe microscopy measurements performed in a pulse tube based top-loading closed-cycle cryostat with a base temperature of 4 K and a 9 T magnet. We decoupled the sample space from the mechanical and acoustic noise from the cryocooling system to enable scanning probe experiments. The extremely low vibration amplitudes in our system enabled successful imaging of 0.39 nm lattice steps on single crystalline SrTiO$_{3}$ as well as magnetic vortices in Bi$_{2}$Sr$_{2}$CaCu$_{2}$O$_{8+x}$ superconductor. Fine control over sample temperature and applied magnetic field further enabled us to probe the helimagnetic and the skyrmion-lattice phases in Fe$_{0.5}$Co$_{0.5}$Si with unprecedented signal-to-noise ratio of 20:1. Finally, we demonstrate for the first time quartz-crystal tuning fork shear-force microscopy in a closed-cycle cryostat.
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In-vacuo cryogenic environments are ideal for applications requiring both low temperatures and extremely low particle densities. This enables reaching long storage and coherence times for example in ion traps, essential requirements for experiments with highly charged ions, quantum computation, and optical clocks. We have developed a novel cryostat continuously refrigerated with a pulse-tube cryocooler and providing the lowest vibration level reported for such a closed-cycle system with 1 W cooling power for a <5 K experiment. A decoupling system suppresses vibrations from the cryocooler by three orders of magnitude down to a level of 10 nm peak amplitudes in the horizontal plane. Heat loads of about 40 W (at 45 K) and 1 W (at 4 K) are transferred from an experimental chamber, mounted on an optical table, to the cryocooler through a vacuum-insulated massive 120 kg inertial copper pendulum. The 1.4 m long pendulum allows installation of the cryocooler in a separate, acoustically isolated machine room. In the laser laboratory, we measured the residual vibrations using an interferometric setup. The positioning of the 4 K elements is reproduced to better than a few micrometer after a full thermal cycle to room temperature. Extreme high vacuum on the $10^{-15}$ mbar level is achieved. In collaboration with the Max-Planck-Intitut fur Kernphysik (MPIK), such a setup is now in operation at the Physikalisch-Technische Bundesanstalt (PTB) for a next-generation optical clock experiment using highly charged ions.
In recent years, self-assembled semiconductor nanowires have been successfully used as ultra-sensitive cantilevers in a number of unique scanning probe microscopy (SPM) settings. We describe the fabrication of ultra-low dissipation patterned silicon nanowire (SiNW) arrays optimized for scanning probe applications. Our fabrication process produces, with high yield, ultra-high aspect ratio vertical SiNWs that exhibit exceptional force sensitivity. The highest sensitivity SiNWs have thermomechanical-noise limited force sensitivity of $9.7pm0.4~text{aN}/sqrt{text{Hz}}$ at room temperature and $500pm20~text{zN}/sqrt{text{Hz}}$ at 4 K. To facilitate their use in SPM, the SiNWs are patterned within $7~mutext{m}$ from the edge of the substrate, allowing convenient optical access for displacement detection.
Moire superlattices in van der Waals heterostructures are gaining increasing attention because they offer new opportunities to tailor and explore unique electronic phenomena when stacking 2D materials with small twist angles. Here, we reveal local surface potentials associated with stacking domains in twisted double bilayer graphene (TDBG) moire superlattices. Using a combination of both lateral Piezoresponse Force Microscopy (LPFM) and Scanning Kelvin Probe Microscopy (SKPM), we distinguish between Bernal (ABAB) and rhombohedral (ABCA) stacked graphene and directly correlate these stacking configurations with local surface potential. We find that the surface potential of the ABCA domains is ~15 mV higher (smaller work function) than that of the ABAB domains. First-principles calculations based on density functional theory further show that the different work functions between ABCA and ABAB domains arise from the stacking dependent electronic structure. We show that, while the moire superlattice visualized by LPFM can change with time, imaging the surface potential distribution via SKPM appears more stable, enabling the mapping of ABAB and ABCA domains without tip-sample contact-induced effects. Our results provide a new means to visualize and probe local domain stacking in moire superlattices along with its impact on electronic properties.
The graphene moire structures on metals, as they demonstrate both long (moire) and short (atomic) scale ordered structures, are the ideal systems for the application of scanning probe methods. Here we present the complex studies of the graphene/Ir(111) system by means of 3D scanning tunnelling and atomic force microscopy/spectroscopy as well as Kelvin-probe force microscopy. All results clearly demonstrate a variation of the moire and atomic scale contrasts as a function of the bias voltage as well as the distance between the scanning probe and the sample, allowing to discriminate between topographic and electronic contributions in the imaging of a graphene layer on metals. The presented results are accompanied by the state-of-the-art density functional theory calculations demonstrating the excellent agreement between theoretical and experimental data.
Below its Neel temperature, the frustrated magnet CdCr$_2$O$_4$ exhibits an antiferromagnetic spin-spiral ground state. Such states can give rise to a sizable magnetoelectric coupling. In this report, we measure the electric polarization induced in single-crystalline CdCr$_2$O$_4$ by a large applied magnetic field. Because the detection of a macroscopic polarization is hindered by the structural domains in the tetragonal spin-spiral phase, we have pioneered an alternative method of measuring polarization induced by high magnetic fields, using electrostatic force microscopy. This method enables us to measure polarization from nanometer sized areas of the sample surface, as well as imaging how to charge inhomogeneities change with magnetic field.
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