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Compressive Phase Contrast Tomography

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 Added by Stefano Marchesini
 Publication date 2010
  fields Physics
and research's language is English




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When x-rays penetrate soft matter, their phase changes more rapidly than their amplitude. In- terference effects visible with high brightness sources creates higher contrast, edge enhanced images. When the object is piecewise smooth (made of big blocks of a few components), such higher con- trast datasets have a sparse solution. We apply basis pursuit solvers to improve SNR, remove ring artifacts, reduce the number of views and radiation dose from phase contrast datasets collected at the Hard X-Ray Micro Tomography Beamline at the Advanced Light Source. We report a GPU code for the most computationally intensive task, the gridding and inverse gridding algorithm (non uniform sampled Fourier transform).



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152 - S. Marchesini 2008
Any object on earth has two fundamental properties: it is finite, and it is made of atoms. Structural information about an object can be obtained from diffraction amplitude measurements that account for either one of these traits. Nyquist-sampling of the Fourier amplitudes is sufficient to image single particles of finite size at any resolution. Atomic resolution data is routinely used to image molecules replicated in a crystal structure. Here we report an algorithm that requires neither information, but uses the fact that an image of a natural object is compressible. Intended applications include tomographic diffractive imaging, crystallography, powder diffraction, small angle x-ray scattering and random Fourier amplitude measurements.
We present differential phase-contrast optical coherence tomography (DPC-OCT) with two transversally separated probing beams to sense phase gradients in various directions by employing a rotatable Wollaston prism. In combination with a two-dimensional mathe- matical reconstruction algorithm based on a regularized shape from shading (SfS) method accurate quantitative phase maps can be determined from a set of two orthogonal en-face DPC-OCT images, as exemplified on various technical samples.
Ultrafast nanocrystallography has the potential to revolutionize biology by enabling structural elucidation of proteins for which it is possible to grow crystals with 10 or fewer unit cells on the side. The success of nanocrystallography depends on robust orientation-determination procedures that allow us to average diffraction data from multiple nanocrystals to produce a three dimensional (3D) diffraction data volume with a high signal-to-noise ratio. Such a 3D diffraction volume can then be phased using standard crystallographic techniques. Indexing algorithms used in crystallography enable orientation determination of diffraction data from a single crystal when a relatively large number of reflections are recorded. Here we show that it is possible to obtain the exact lattice geometry from a smaller number of measurements than standard approaches using a basis pursuit solver.
We present a compressive quantum process tomography scheme that fully characterizes any rank-deficient completely-positive process with no a priori information about the process apart from the dimension of the system on which the process acts. It uses randomly-chosen input states and adaptive output von Neumann measurements. Both entangled and tensor-product configurations are flexibly employable in our scheme, the latter which naturally makes it especially compatible with many-body quantum computing. Two main features of this scheme are the certification protocol that verifies whether the accumulated data uniquely characterize the quantum process, and a compressive reconstruction method for the output states. We emulate multipartite scenarios with high-order electromagnetic transverse modes and optical fibers to positively demonstrate that, in terms of measurement resources, our assumption-free compressive strategy can reconstruct quantum processes almost equally efficiently using all types of input states and basis measurement operations, operations, independent of whether or not they are factorizable into tensor-product states.
Detection of phase variations across optically transparent samples is often a difficult task. We propose and demonstrate a compact, lightweight and low cost quantitative phase contrast imager. Light diffracted from a pinhole is incident on a thick object and the modulated light is collected by an image sensor and the intensity pattern is recorded. Two optical configurations namely lens-based and lensless cases are compared. A modified phase-retrieval algorithm is implemented to extract the phase information of the sample at different axial planes from a single camera shot.
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