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Optimization of reversible sequential circuits

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 Added by William Jackson
 Publication date 2010
and research's language is English




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In recent years reversible logic has been considered as an important issue for designing low power digital circuits. It has voluminous applications in the present rising nanotechnology such as DNA computing, Quantum Computing, low power VLSI and quantum dot automata. In this paper we have proposed optimized design of reversible sequential circuits in terms of number of gates, delay and hardware complexity. We have designed the latches with a new reversible gate and reduced the required number of gates, garbage outputs, and delay and hardware complexity. As the number of gates and garbage outputs increase the complexity of reversible circuits, this design will significantly enhance the performance. We have proposed reversible D-latch and JK latch which are better than the existing designs available in literature.



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76 - Avik Chakraborty 2010
Reversible circuits find applications in many areas of Computer Science including Quantum Computation. This paper examines the testability of an important subclass of reversible logic circuits that are composed of k-wire controlled NOT (k-CNOT with k >/- 1) gates. A reversible k-CNOT gate can be implemented using an irreversible k-input AND gate and an EXOR gate. A reversible k-CNOT circuit where each k-CNOT gate is realized using irreversible k-input AND and EXOR gate, has been considered. One of the most commonly used Single Bridging Fault model (both wired-AND and wired-OR) has been assumed to be type of fault for such circuits. It has been shown that an (n+p)-input AND-EXOR based reversible logic circuit with p observable outputs, can be tested for single bridging faults (SBF) using (3n + lefthalfcap log2p righthalfcap + 2) tests.
181 - Avik Chakraborty 2020
Iterative Logic Arrays (ILAs) are ideal as VLSI sub-systems because of their regular structure and its close resemblance with FPGAs (Field Programmable Gate Arrays). Reversible circuits are of interest in the design of very low power circuits where energy loss implied by high frequency switching is not of much consideration. Reversibility is essential for Quantum Computing. This paper examines the testability of Reversible Iterative Logic Arrays (ILAs) composed of reversible k-CNOT gates. For certain ILAs it is possible to find a test set whose size remains constant irrespective of the size of the ILA, while for others it varies with array size. Former type of ILAs is known as Constant-Testable, i.e. C-Testable. It has been shown that Reversible Logic Arrays are C-Testable and size of test set is equal to number of entries in cells truth table implying that the reversible ILAs are also Optimal-Testable, i.e. O-Testable. Uniform-Testability, i.e. U-Testability has been defined and Reversible Heterogeneous ILAs have been characterized as U-Testable. The test generation problem has been shown to be related to certain properties of cycles in a set of graphs derived from cell truth table. By careful analysis of these cycles an efficient test generation technique that can be easily converted to an ATPG program has been presented for both 1-D and 2D ILAs. The same algorithms can be easily extended for n-Dimensional Reversible ILAs.
166 - Stephen P. Jordan 2013
It is well-known that deciding equivalence of logic circuits is a coNP-complete problem. As a corollary, the problem of deciding weak equivalence of reversible circuits, i.e. ignoring the ancilla bits, is also coNP-complete. The complexity of deciding strong equivalence, including the ancilla bits, is less obvious and may depend on gate set. Here we use Barringtons theorem to show that deciding strong equivalence of reversible circuits built from the Fredkin gate is coNP-complete. This implies coNP-completeness of deciding strong equivalence for other commonly used universal reversible gate sets, including any gate set that includes the Toffoli or Fredkin gate.
428 - Nuno Alves 2008
Reversible logic is experience renewed interest as we are approach the limits of CMOS technologies. While physical implementations of reversible gates have yet to materialize, it is safe to assume that they will rely on faulty individual components. In this work we present a present a method to provide fault tolerance to a reversible circuit based on invariant relationships.
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