We have carried out a systematic experimental investigation to address the question why thin films of Fe$_3$O$_4$ (magnetite) generally have a very broad Verwey transition with lower transition temperatures as compared to the bulk. We observed using x-ray photoelectron spectroscopy, x-ray diffraction and resistivity measurements that the Verwey transition in thin films is drastically influenced not only by the oxygen stoichiometry but especially also by the substrate-induced microstructure. In particular, we found (1) that the transition temperature, the resistivity jump, and the conductivity gap of fully stoichiometric films greatly depends on the domain size, which increases gradually with increasing film thickness, (2) that the broadness of the transition scales with the width of the domain size distribution, and (3) that the hysteresis width is affected strongly by the presence of antiphase boundaries. Films grown on MgO (001) substrates showed the highest and sharpest transitions, with a 200 nm film having a T$_V$ of 122K, which is close to the bulk value. Films grown on substrates with large lattice constant mismatch revealed very broad transitions, and yet, all films show a transition with a hysteresis behavior, indicating that the transition is still first order rather than higher order.
The standard way to find the orbital occupation of Jahn-Teller (JT) ions is to use structural data, with the assumption of a one-to-one correspondence between the orbital occupation and the associated JT distortion, e.g. in O6 octahedron. We show, however, that this approach in principle does not work for layered systems. Specifically, using the layered manganite La0.5Sr1.5MnO4 as an example, we found from our x-ray absorption measurements and theoretical calculations, that the type of orbital ordering strongly contradicts the standard local distortion approach for the Mn3+O6 octahedra, and that the generally ignored long-range crystal field effect and anisotropic hopping integrals are actually crucial to determine the orbital occupation. Our findings may open a pathway to control of the orbital state in multilayer systems and thus of their physical properties.
We studied the (001/2) diffraction peak in the low-temperature phase of magnetite (Fe3O4) using resonant soft x-ray diffraction (RSXD) at the Fe-L2,3 and O-K resonance. We studied both molecular-beam-epitaxy (MBE) grown thin films and in-situ cleaved single crystals. From the comparison we have been able to determine quantitatively the contribution of intrinsic absorption effects, thereby arriving at a consistent result for the (001/2) diffraction peak spectrum. Our data also allow for the identification of extrinsic effects, e.g. for a detailed modeling of the spectra in case a dead surface layer is present that is only absorbing photons but does not contribute to the scattering signal.
We studied the stripe phase of La1.8Sr0.2NiO4 using neutron diffraction, resonant soft x-ray diffraction (RSXD) at the Ni L2,3 edges, and resonant x-ray diffraction (RXD) at the Ni K threshold. Differences in the q-space resolution of the different techniques have to be taken into account for a proper evaluation of diffraction intensities associated with the spin and charge order superstructures. We find that in the RSXD experiment the spin and charge order peaks show the same temperature dependence. In the neutron experiment by contrast, the spin and charge signals follow quite different temperature behaviors. We infer that fluctuating magnetic order contributes considerably to the magnetic RSXD signal and we suggest that this result may open an interesting experimental approach to search for fluctuating order in other systems by comparing RSXD and neutron diffraction data.
Using Co-L_(2,3) and O-K x-ray absorption spectroscopy, we reveal that the charge ordering in La_(1.5)Sr_(0.5)CoO4 involves high spin (S=3/2) Co^2+ and low spin (S=0) Co^3+ ions. This provides evidence for the spin blockade phenomenon as a source for the extremely insulating nature of the La_(2-x)Sr_(x)CoO4 series. The associated e_g^2 and e_g^0 orbital occupation accounts for the large contrast in the Co-O bond lengths, and in turn, the high charge ordering temperature. Yet, the low magnetic ordering temperature is naturally explained by the presence of the non-magnetic (S=0) Co^3+ ions. From the identification of the bands we infer that La_(1.5)Sr_(0.5)CoO4 is a narrow band material.
We compare for Ho metal the x-ray absorption spectrum and the resonant soft x-ray diffraction spectra obtained at the $3d_{5/2} to 4f$ ($M_5$) resonance for the magnetic 1st and 2nd order diffraction peaks $(0,0,tau)$ and $(0,0,2tau)$ with the result of an atomic multiplet calculation. We find a good agreement between experiment and simulation giving evidence that this kind of simulation is well suited to quantitatively analyze resonant soft x-ray diffraction data from correlated electron systems.
We studied the resonant diffraction signal from stepped surfaces of SrTiO3 at the Ti 2p -> 3d (L2,3) resonance in comparison with x-ray absorption (XAS) and specular reflectivity data. The steps on the surface form an artificial superstructure suited as a model system for resonant soft x-ray diffraction. A small step density on the surface is sufficient to produce a well defined diffraction peak, showing the high sensitivity of the method. At larger incidence angles, the resonant diffraction spectrum from the steps on the surface resembles the spectrum for specular reflectivity. Both deviate from the XAS data in the relative peak intensities and positions of the peak maxima. We determined the optical parameters of the sample across the resonance and found that the differences between the XAS and scattering spectra reflect the different quantities probed in the different signals. When recorded at low incidence or detection angles, XAS and specular reflectivity spectra are distorted by the changes of the angle of total reflection with energy. Also the step peak spectra, though less affected, show an energy shift of the peak maxima in grazing incidence geometry.
