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The activity generated by an ensemble of neurons is affected by various noise sources. It is a well-recognised challenge to understand the effects of noise on the stability of such networks. We demonstrate that the patterns of activity generated by networks of grid cells emerge from the instability of homogeneous activity for small levels of noise. This is carried out by upscaling a noisy grid cell model to a system of partial differential equations in order to analyse the robustness of network activity patterns with respect to noise. Inhomogeneous network patterns are numerically understood as branches bifurcating from unstable homogeneous states for small noise levels. We prove that there is a phase transition occurring as the level of noise decreases. Our numerical study also indicates the presence of hysteresis phenomena close to the precise critical noise value.
This manuscript extends the analysis of a much studied singularly perturbed three-component reaction-diffusion system for front dynamics in the regime where the essential spectrum is close to the origin. We confirm a conjecture from a preceding paper
We investigate the effects of exponentially correlated noise on birhythmic van der Pol type oscillators. The analytical results are obtained applying the quasi-harmonic assumption to the Langevin equation to derive an approximated Fokker-Planck equat
Neural field models with transmission delay may be cast as abstract delay differential equations (DDE). The theory of dual semigroups (also called sun-star calculus) provides a natural framework for the analysis of a broad class of delay equations, a
The paper studies the long time behavior of a system that describes the motion of a piece of elastic membrane driven by surface tension and inner air pressure. The system is a degenerate quasilinear hyperbolic one that involves the mean curvature, an
In this paper, we consider a drift-diffusion system describing the corrosion of an iron based alloy in a nuclear waste repository. In comparison with the classical drift-diffusion system arising in the modeling of semiconductor devices, the originali