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We investigate WSe$_2$-MoSe$_2$ heterobilayers with different twist angles $theta pm delta$ between the two layers, by low-frequency Raman scattering. In sufficiently aligned samples with $theta=0^circ$, or $theta=60^circ$, and $delta lesssim 3^circ$, we observe an interlayer shear mode (ISM), which is a clear sign of a commensurate bilayer structure, i.e., the layers must undergo an atomic reconstruction to form R-type or H-type stacking orders. We find slightly different ISM energies of about 18~cm$^{-1}$ and 17~cm$^{-1}$ for H-type and R-type reconstructions, respectively, independent of the exact value of $thetapm delta$. Our findings are corroborated by the fact that the ISM is not observed in samples with twist angles, which deviate by $delta > 3^circ$ from $0^circ$ or $60^circ$. This is expected, since in such incommensurate structures, with the possibility of Moir$acute{text{e}}$-lattice formation, there is no restoring force for an ISM. Furthermore, we observe the ISM even in sufficiently aligned heterobilayers, which are encapsulated in hexagonal Boron nitride. This is particularly relevant for the characterization of high-quality heterostructure devices.
The optical spectra of vertically stacked MoSe$_2$/WSe$_2$ heterostructures contain additional interlayer excitonic peaks that are absent in the individual monolayer materials and exhibit a significant spatial charge separation in out-of-plane direct
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